Measurement of friction coefficients with the atomic force microscope

Attard, Phil; Stiernstedt, Johanna; Rutland, Mark W.

doi:10.1088/1742-6596/61/1/011

Cited by 10 publications

(15 citation statements)

References 23 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The slopes of the linear least square fits in both cases yield the coefficient of friction to be 0.24. This is in general agreement with the coefficient of friction reported for Muscovite mica in the literature [21], [29]- [31]. However, it is worth mentioning that the linear dependence of friction on normal force is only an approximate description.…”

Section: B Measurement Of 3-d Tip-sample Interaction Forcessupporting

confidence: 91%

See 1 more Smart Citation

Direct Measurement of Three-Dimensional Forces in Atomic Force Microscopy

Mrinalini

Sriramshankar

Jayanth

2015

IEEE/ASME Trans. Mechatron.

View full text Add to dashboard Cite

Direct measurement of three-dimensional (3-D) forces between an atomic force microscope (AFM) probe and the sample benefits diverse applications of AFM, including force spectroscopy, nanometrology, and manipulation. This paper presents the design and evaluation of a measurement system, wherein the deflection of the AFM probe is obtained at two points to enable direct measurement of all the three components of 3-D tip-sample forces in real time. The optimal locations for measurement of deflection on the probe are derived for a conventional AFM probe. Further, a new optimal geometry is proposed for the probe that enables measurement of 3-D forces with identical sensitivity and nearly identical resolution along all three axes. Subsequently, the designed measurement system and the optimized AFM probe are both fabricated and evaluated. The evaluation demonstrates accurate measurement of tip-sample forces with minimal cross-sensitivities. Finally, the real-time measurement system is employed as part of a feedback control system to regulate the normal component of the interaction force, and to perform force-controlled scribing of a groove on the surface of polymethyl methacrylate.Index Terms-Atomic force microscopy (AFM), direct measurement of 3-D forces, force control, optical beam deflection.

show abstract

Section: B Measurement Of 3-d Tip-sample Interaction Forcessupporting

confidence: 91%

“…Finally, noticing that θ x (y i ) = V y (y i )/k phx (y i ), (29) and (30) can be employed to obtain the constants k phx (y i )(i = 1, 2) as…”

mentioning

confidence: 99%

Direct Measurement of Three-Dimensional Forces in Atomic Force Microscopy

Mrinalini

Sriramshankar

Jayanth

2015

IEEE/ASME Trans. Mechatron.

View full text Add to dashboard Cite

show abstract

“…In the near future, we plan to address the current low force and low stiffness limitations of TLFC with much softer microfabricated TRL devices. (2) This paper demonstrates that the TLFC method itself is no more involved than an ordinary friction measurement and should not impede broad adoption by outside user groups who have access to a calibrated device. We will consider fabricating, calibrating, and distributing TRL devices to outside groups upon request.…”

Section: Discussionmentioning

confidence: 91%

“…1 and 2 gives k AFM = 119.9 ± 0.1 N/m and C AFM = 2.25 ± 0.01 μN/V. 2 The experimentally observed uncertainties in the lateral stiffness and force calibration constant were 0.1% and 0.4%, respectively. The measured lateral stiffness of 120 N/m is consistent with the calculated expected range of 110-500 N/m.…”

Section: High Load Afm With Custom Colloidal Probesmentioning

confidence: 89%

“…The force calibration constant, which we define here as friction force per unit transducer voltage, depends on the length of the torsional moment arm, the torsional spring constant of the cantilever, the optical lever design of the AFM, the position of the laser on the cantilever, and the sensitivity of the PSD, among other factors. Unfortunately, quantifying the force calibration constant with well-defined uncertainty and traceability to absolute force standards has proven difficult due to (1) the need for a calibration standard of atomic scale mass/force; (2) the need to apply that calibration force laterally to the apex of a nanoscale tip; (3) inherent complexities of the atomic scale force transduction process [1][2][3][4][5][6].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

et al. 2020

View full text Add to dashboard Cite

Efforts to reliably measure AFM lateral forces have been impeded by the difficulties in obtaining appropriate calibration standards, applying those force standards to the apex of the tip, and quantifying calibration uncertainty. Here we propose a new method, Traceable Lateral Force Calibration (TLFC), which combines the reliability of direct methods with the convenience of indirect/semi-direct methods. Like other direct methods, ours comprise three essential steps: (1) fabrication of a spring (the Traceable Reference Lever or TRL); (2) calibration of the TRL spring constant; (3) conversion of measurable TRL deflections into absolute lateral force measurements based on its pre-calibrated spring constant (TLFC method). The TRL device, a simple two-axis cantilever, is easy to design, fabricate, and directly pre-calibrate with a standard laboratory microbalance. Following pre-calibration, the TRL device becomes a convenient absolute standard for AFM lateral force measurements. This paper describes the complete method and demonstrates its primary merits, which include (1) traceability to measurement standards; (2) ease of use by outside user groups; (3) absolute measurement errors < 10% for moderately stiff cantilevers (> 1 N/m normal stiffness); (4) robustness over a wide range of common loads, instruments, probes, and environments. While the method and proof-of-concept devices described in this paper were designed primarily for moderate to high load cantilevers (> 1 N/m), we discuss how a next generation of compliant TRL devices can be used with the TLFC method to reliably calibrate arbitrary AFM cantilevers (< < 1 N/m) and forces. Arnab Bhattacharjee and Nikolay T. Garabedian Co lead authors.

show abstract