1992
DOI: 10.1021/la00043a024
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Measurement of forces in liquids using a force microscope

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Cited by 1,092 publications
(962 citation statements)
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“…With the AFM DLVO forces were measured between several materials which are of special interest in colloidal science, e.g. glass, silica, and silicon nitride [15,16,187,[427][428][429][430][431][432][433][434]; gold [327,429,435,436]; copper and nickel [437]; zinc and lead sulphide [171,172,438]; titanium oxide [169,339,340]; zirconia [165,166,410]; iron oxide [439]; tungsten [175]; cobalt [175]; and alumina [16,[439][440][441][442]. Different polymers [177,189,[443][444][445][446][447], Langmuir-Blodgett and other thin organic layers [126,329,411,448,449] have been analyzed.…”
Section: Electrostatic Double-layer Force and Dlvo Theorymentioning
confidence: 99%
“…With the AFM DLVO forces were measured between several materials which are of special interest in colloidal science, e.g. glass, silica, and silicon nitride [15,16,187,[427][428][429][430][431][432][433][434]; gold [327,429,435,436]; copper and nickel [437]; zinc and lead sulphide [171,172,438]; titanium oxide [169,339,340]; zirconia [165,166,410]; iron oxide [439]; tungsten [175]; cobalt [175]; and alumina [16,[439][440][441][442]. Different polymers [177,189,[443][444][445][446][447], Langmuir-Blodgett and other thin organic layers [126,329,411,448,449] have been analyzed.…”
Section: Electrostatic Double-layer Force and Dlvo Theorymentioning
confidence: 99%
“…The liquid medium used in the force measurements was the supernatant of the tailings slurries produced from the bitumen extraction tests. The detailed procedure of AFM force measurements has been described elsewhere (Ducker and Senden, 1992;Long et al, 2005). Briefly, a sample surface moves towards and away from a cantilever tip (colloid probe) by the extension and retraction of an AFM piezotube.…”
Section: Colloidal Force Measurementmentioning
confidence: 99%
“…30 The cantilever deflects linearly with piezo position and the probe makes rigid contact with the sample surface. Since the cantilever is too weak to cause deformation of the sample, cantilever deflection in the "constant compliance" region must be entirely due to the movement of the piezo.…”
Section: Methodsmentioning
confidence: 99%