Measurement complex to investigate electrophysical and noise characteristics of semiconductor micro- and nanostructures

Litvinov, V. G.; Ermachikhin, A. V.; Kusakin, D. S.; Vishnyakov, N. V.; Maslov, A. D.; Семенов, А. Л.

doi:10.1109/icnf.2017.7986021

2017 International Conference on Noise and Fluctuations (ICNF) 2017

DOI: 10.1109/icnf.2017.7986021

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Measurement complex to investigate electrophysical and noise characteristics of semiconductor micro- and nanostructures

V. G. Litvinov

A. V. Ermachikhin

D. S. Kusakin

et al.

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Cited by 2 publications

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Measurement complex to investigate electrophysical and noise characteristics of semiconductor micro- and nanostructures

Cited by 2 publications

References 13 publications

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Investigation of (Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf>)<inf>1−x</inf>Bi<inf>x</inf> thin films by low frequency noise spectroscopy

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