2017 International Conference on Noise and Fluctuations (ICNF) 2017
DOI: 10.1109/icnf.2017.7986006
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Investigation of (Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf>)<inf>1−x</inf>Bi<inf>x</inf> thin films by low frequency noise spectroscopy

V. G. Litvinov
1
,
A. V. Ermachikhin
2
,
T. A. Kholomina
3
et al.
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