2018
DOI: 10.3390/s18082603
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Measurement and Isolation of Thermal Stress in Silicon-On-Glass MEMS Structures

Abstract: The mechanical stress in silicon-on-glass MEMS structures and a stress isolation scheme were studied by analysis and experimentation. Double-ended tuning forks (DETFs) were used to measure the stress based on the stress-frequency conversion effect. Considering the coefficients of thermal expansion (CTEs) of silicon and glass and the temperature coefficient of the Young’s modulus of silicon, the sensitivity of the natural frequency to temperature change was analyzed. A stress isolation mechanism composed of ann… Show more

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Cited by 15 publications
(5 citation statements)
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“…Preventing a mismatch of the coefficients of thermal expansion (CTE) in the production of MEMS devices is of great importance to reduce thermal stress at the material boundaries. [ 295 ] This is particularly important at high temperatures, which are which are needed in solder reflow processes. With printed electronics technologies, low temperature processible materials can be used and temperature variations can be largely avoided.…”
Section: Applicationsmentioning
confidence: 99%
“…Preventing a mismatch of the coefficients of thermal expansion (CTE) in the production of MEMS devices is of great importance to reduce thermal stress at the material boundaries. [ 295 ] This is particularly important at high temperatures, which are which are needed in solder reflow processes. With printed electronics technologies, low temperature processible materials can be used and temperature variations can be largely avoided.…”
Section: Applicationsmentioning
confidence: 99%
“…In the SOIMUMPs process, the stress gradient in the device layer used for creating the mechanical structures originates primarily during the doping step [ 48 ]. In addition, the difference in coefficients of thermal expansion is also significant when multiple layers are in contact [ 54 , 55 ]. This effect can be incorporated in the model if the stresses of the constituent layers are known.…”
Section: Sensor Designmentioning
confidence: 99%
“…The measurement of stress includes three kinds of methods: non-destructive, micro-damage, and damage [ 10 , 11 , 12 , 13 , 14 ]. Both damage and micro-damage measurement methods can cause damage to the measured part and these damages are fatal to the finished parts or the workpieces in service.…”
Section: Introductionmentioning
confidence: 99%