2016
DOI: 10.1007/s00339-015-9592-3
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MD simulation of effect of crystal orientations and substrate temperature on growth of Cu/Ni bilayer films

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Cited by 27 publications
(7 citation statements)
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“…The embedded atom method (EAM) potential developed by Daw and Baskes 22 23 was chosen to describe the force between the atoms in the multilayer films, involving Cu-Cu, Ni-Ni and Cu-Ni interatomic potentials. The parameters for the potentials were given by Zhou and Wadley 24 , which had been validated to be able to reproduce the physical properties of Cu-Ni system 25 . The Morse potential 26 , which had widely been used to solve surface contact problems 27 28 , was adopted to compute the interaction between the atoms in the indenter and multilayer film (C-Ni and C-Cu potentials), and the parameters involved were taken from the works by Chang et al .…”
Section: Methodsmentioning
confidence: 99%
“…The embedded atom method (EAM) potential developed by Daw and Baskes 22 23 was chosen to describe the force between the atoms in the multilayer films, involving Cu-Cu, Ni-Ni and Cu-Ni interatomic potentials. The parameters for the potentials were given by Zhou and Wadley 24 , which had been validated to be able to reproduce the physical properties of Cu-Ni system 25 . The Morse potential 26 , which had widely been used to solve surface contact problems 27 28 , was adopted to compute the interaction between the atoms in the indenter and multilayer film (C-Ni and C-Cu potentials), and the parameters involved were taken from the works by Chang et al .…”
Section: Methodsmentioning
confidence: 99%
“…According to lattice mismatch parameter on an interface, δ = (a A − a B )/a A , the multilayered films consisting of the constituents (A and B) with the same lattice structure can be divided into three groups, namely, coherent (δ ≤ 5%), semi-coherent (5% ≤ δ ≤ 25%), and non-coherent multilayer (δ ≥ 25%) groups. It is known that molecular dynamics (MD) simulation is an effective method to study the deformation and mechanical behavior of materials [24][25][26][27][28]. For example, with MD simulation, Shao et al studied the relaxation mechanisms and misfit dislocation patterns of semi-coherent interfaces in a FCC/FCC multilayered film [29][30][31][32], where FCC is the abbreviation for Face-Centered Cubic.…”
mentioning
confidence: 99%
“…The embedded atom method (EAM) developed by Daw et al [ 22 ] has been widely adopted to study the defects and their evolution [ 23 ], dislocation-CTB interaction [ 13 , 24 , 25 ], and deposition and growth problems [ 26 ] in metals and alloys. In the MD simulation for the nanoindentation on nt-Ta films, EAM potential [ 22 ] is employed and the parameters suggested by Ravelo et al [ 27 ] are adopted.…”
Section: Methodsmentioning
confidence: 99%