Lasers as Tools for Manufacturing of Durable Goods and Microelectronics 1996
DOI: 10.1117/12.237768
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Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor

Abstract: We demonstrate the use of a nonsteady-state photo-inducedemf adaptive photodetector as a robust, low-cost laser ultrasonic sensor. This class of sensor enables high-fractional bandwidth ultrasound detection and, in addition, all-optical compensation of adverse in-factory noise, including vibration, speckle, relative platform motion, and optical fiber modal dispersion. Reference-beam and fiber-based time-delay interferometric configurations were demonstrated, as well as the ue of a diode laser as a compact opti… Show more

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Cited by 22 publications
(13 citation statements)
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“…Laser-based ultrasound [1,2], LBU, has the potential to be a robust, reconfigurable, noncontact diagnostic for many industrial applications. A simple and inexpensive semiconductor sensor based on the nonsteady-state photo-induced-electromotive force (photo-emf) effect [3,4], has been demonstrated [5] to be functional under a variety of manufacturing conditions and in probing various materials, including metals, semiconductors, and organics. This device has the potential to remotely sense ultrasound via speckle motion or coherent detection over a reasonable field-of-view, with good bandwidth and detection sensitivity.…”
Section: Introductionmentioning
confidence: 99%
“…Laser-based ultrasound [1,2], LBU, has the potential to be a robust, reconfigurable, noncontact diagnostic for many industrial applications. A simple and inexpensive semiconductor sensor based on the nonsteady-state photo-induced-electromotive force (photo-emf) effect [3,4], has been demonstrated [5] to be functional under a variety of manufacturing conditions and in probing various materials, including metals, semiconductors, and organics. This device has the potential to remotely sense ultrasound via speckle motion or coherent detection over a reasonable field-of-view, with good bandwidth and detection sensitivity.…”
Section: Introductionmentioning
confidence: 99%
“…An A-scan of the compensated LBU system output is shown in Figure 4. For this measurement, we employed the GaAs-based photo-emf detector [7]. In the figure, we show results for two cases: In one case, a sample was tested at a point where it was established by other NDE means that a good epoxy bond existed, whereas, in the second case, a typical void region was probed.…”
Section: Laser-ultrasonic Inspection Of Flip-chip Underfillmentioning
confidence: 99%
“…In addition, a DPCM system using barium titanate (as the nonlinear element) requires one to dwell on the workpiece, for"" 10 to 100 msec, so that the crystal can properly respond. A GaAs-based photo-emf detector, on the other hand, has been shown [7] to provide for substantial compensation of both spatial as well as global whole-body phase shifts, with much greater noise compensation bandwidth ( "" 1 0 kHz) but, at present, has a predicted shot-noise limited sensitivity down by a factor of six relative to that of the DPCM-based system, the latter of which has been demonstrated to be near-shot-noise limited [8].…”
Section: Compensated Laser Ultrasonic Receiversmentioning
confidence: 99%
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