Mapping strains at the nanoscale using electron back scatter diffraction

Estimating geometric dislocation densities in polycrystalline materials from orientation imaging microscopy

“…As illustrated in these and other works, there do seem to be many instances pertaining to ductile metals such as aluminum and copper where elastic strains are negligible. New techniques in EBSD tomography (see, e.g., Wilkinson et al, 2006Wilkinson et al, , 2009 and in three-dimensional X-ray microscopy (see Ice and Barabash, 2007;Larson et al, 2007Larson et al, , 2008 are being developed for spatially resolved measurements of both elastic strains and lattice orientation. These new techniques are promising, but they are still in development.…”

Assessment of surface hardening effects from shot peening on a Ni-based alloy using electron backscatter diffraction techniques

“…More recent studies [15][16][17], have highlighted the ability of electron backscatter diffraction (EBSD) data to assess strain hardening levels in alloys, building on use of the focussed ion beam to look more carefully at surface and sub-surface features [18]. Wilkinson et al [19] go further in quantifying strain, using cross-correlation measurements of small shifts in EBSD patterns, to a sensitivity of 10 -4 . Deformation assessments have also been achieved with measures of an 'image quality' parameter.…”

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

“…Application of this procedure to compare two EBSPs to evaluate strain and lattice rotation is now fairly common and has resulted in accurate measurement of absolute strain and rotations around fatigue cracks in Ni [7]; four point bending in Si [8]; indents in Si [9], Ti [10], and Fe [11]; strain accumulation in ferrite and martensite [12]; and SiGe mesas [8,13]. Measurement of absolute strain in some of these experiments was possible by 3) orientation in Bunge Euler angle notation; (b) dynamic simulation of pattern with minimum plane spacing of 0.5Å and no inelastic scattering anistropy; (c) Bragg simulation with 204 reflectors and no higher orders; (d) improved Bragg simulation with simple band profile and higher order reflectors (as in [8,21]).…”