Mapping nanoscale thermal transfer in-liquid environment—immersion scanning thermal microscopy

Tovee, Peter; Kolosov, Oleg

doi:10.1088/0957-4484/24/46/465706

Cited by 30 publications

(28 citation statements)

References 46 publications

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“…The equivalent thermal resistance of the SThM probe is schematically presented in Fig. 2, in line with previously reported models [4,23].…”

Section: Analytical Model Of the Sthm Probesupporting

confidence: 85%

“…6 displays a typical SEM image of a MWCNT-SThM probe. Further details of the SThM probe calibration and measurements are available in our previous work [6,23]. In brief, a controlled Joule heating power was applied to the probe, with probe temperature measured immediately before (T nc ) and immediately after (T con ) solid-solid contact with the material analyzed.…”

Section: Experimental Methodsmentioning

confidence: 99%

“…For simplicity, the term "NW" is used throughout the paper for both semiconducting and MWCNT nanowires. electrically and thermally [23] (Fig. 1a).…”

Section: Introductionmentioning

confidence: 99%

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Scanning thermal microscopy with heat conductive nanowire probes

et al. 2016

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(2016) 'Scanning thermal microscopy with heat conductive nanowire probes.', Ultramicroscopy., 162 . pp. 42-51.Further information on publisher's website:http://dx.doi.org/10. 1016/j.ultramic.2015.12.006 Publisher's copyright statement: Use policyThe full-text may be used and/or reproduced, and given to third parties in any format or medium, without prior permission or charge, for personal research or study, educational, or not-for-prot purposes provided that:• a full bibliographic reference is made to the original source • a link is made to the metadata record in DRO • the full-text is not changed in any way The full-text must not be sold in any format or medium without the formal permission of the copyright holders.Please consult the full DRO policy for further details. AbstractScanning thermal microscopy (SThM), which enables measurement of thermal transport and temperature distribution in devices and materials with nanoscale resolution is rapidly becoming a key approach in resolving heat dissipation problems in modern processors and assisting development of new thermoelectric materials. In SThM, the self-heating thermal sensor contacts the sample allowing studying of the temperature distribution and heat transport in nanoscaled materials and devices. The main factors that limit the resolution and sensitivities of SThM measurements are the low efficiency of thermal coupling and the lateral dimensions of the probed area of the surface studied. The thermal conductivity of the sample plays a key role in the sensitivity of SThM measurements. During the SThM measurements of the areas with higher thermal conductivity the heat flux via SThM probe is increased compared to the areas with lower thermal conductivity. For optimal SThM measurements of interfaces between low and high thermal conductivity materials, well defined nanoscale probes with high thermal conductivity at the probe apex are required to achieve a higher quality of the probe-sample thermal contact while preserving the lateral resolution of the system.In this paper, we consider a SThM approach that can help address these complex problems by using high thermal conductivity nanowires (NW) attached to a tip apex.We propose analytical models of such NW-SThM probes and analyse the influence of the contact resistance between the SThM probe and the sample studied. The latter becomes particularly important when both tip and sample surface have high thermal conductivities.2 These models were complemented by finite element analysis simulations and experimental tests using prototype probe where a multiwall carbon nanotube (MWCNT) is exploited as an excellent example of a high thermal conductivity NW. These results elucidate critical relationships between the performance of the SThM probe on one hand and thermal conductivity, geometry of the probe and its components on the other. As such, they provide a pathway for optimizing current SThM for nanothermal studies of high thermal conductivity materials. Comparison between experimental and modelling results allows...

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“…The equivalent thermal resistance of the SThM probe is schematically presented in Fig. 2, in line with previously reported models [4,23].…”

Section: Analytical Model Of the Sthm Probesupporting

confidence: 85%

Section: Experimental Methodsmentioning

confidence: 99%

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Scanning thermal microscopy with heat conductive nanowire probes

et al. 2016

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“…9,10,11 Finally, in Scanning Thermal Microscopy (SThM), the thermal dissipation depends to a great extent on a given volume located under the tip and any non-homogeneity can be thus probed. 12, 13,14 A chapter on its own deserves subsurface imaging through the detection of the elastic properties of materials. Ultrasonic Force Microscopy (UFM) is a technique invented by Kolosov and Yamanaka,15 resulting from an adaption of Atomic Force Microscopy (AFM) working in Contact Mode (CM).…”

Section: Introductionmentioning

confidence: 99%

Subsurface imaging of two-dimensional materials at the nanoscale

et al. 2017

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Scanning probe Microscopy (SPM) represents a powerful tool that, in the past thirty years, has allowed one to investigate material surfaces in unprecedented ways at the nanoscale level. However, SPM has shown very little power of depth penetration, whereas several nanotechnology applications would require it. Subsurface imaging has been achieved only in a few cases, when subsurface features influence the physical properties of the surface, such as the electronic states or the heat transfer. Ultrasonic Force Microscopy (UFM), an adaption of the Atomic Force Microscopy (AFM) contact mode, can dynamically measure the stiffness of the elastic contact between the probing tip and the sample surface. In particular, UFM has proven highly sensitive to the near-surface elastic field in non-homogeneous samples.In this paper, we present an investigation of two-dimensional (2D) materials, namely flakes of graphite and molybdenum disulphide placed on structured polymeric substrates.We show that UFM can non-destructively distinguish suspended and supported areas and localize defects, such as buckling or delamination of adjacent monolayers, generated by residual stress. Specifically, UFM can probe small variations in the local indentation induced by the mechanical interaction between tip and sample. Therefore, any change in the elastic modulus within the volume perturbed by the applied load or the flexural bending of the suspended areas can be detected and imaged. Such a power of investigation is very promising in order to investigate the buried interfaces of nanostructured 2D materials such as in graphene-based devices.

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“…During the specimen fabrication stage of the experimental process, it is very important to select a sample geometry and substrate that promote optimal contrast for SThM measurements. It is well known from previous experimental data 24,25 that one of the most important factors to consider is the tip/sample thermal boundary conductance (TBC), also known as Kapitza conductance (σ ts , i.e. the reciprocal of 1/R ts ).…”

Section: Introductionmentioning

confidence: 99%