2014
DOI: 10.1063/1.4895493
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Nanothermal characterization of amorphous and crystalline phases in chalcogenide thin films with scanning thermal microscopy

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Cited by 23 publications
(17 citation statements)
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“…e.g., Refs. [110][111][112][113]). In terms of simulations, calculations of κ for a few crystalline phases can be found in the recent literature [100,114].…”
Section: Thermal Properties Of Phase-change Materialsmentioning
confidence: 99%
“…e.g., Refs. [110][111][112][113]). In terms of simulations, calculations of κ for a few crystalline phases can be found in the recent literature [100,114].…”
Section: Thermal Properties Of Phase-change Materialsmentioning
confidence: 99%
“…Then, when applying this general definition to the SThM system, the hot and cold regions correspond to the probe heater temperature and ambient temperature, respectively. If we just limit ourselves to a qualitative comparison between pristine and annealed flakes supported by the same substrate, the total thermal resistance seen from the probe can be modeled by using a lumped parameters electronic analogue [ 27,40 ] :…”
Section: Let Us First Recall That the Thermal Resistance Is Defined Asmentioning
confidence: 99%
“…microscopy in proximity to the GT surface to detect its thermal property variations due to different heat flow between probe and sample, as illustrated in Figure 8(b). This opens a new way for the write and readout operation of electrical probe phase-change memory [69]. Another promising storage media is GeTe 6 alloy that exhibited low power threshold switching and an extremely low steady state current [70].…”
Section: Recent Progress On Probe Memoriesmentioning
confidence: 99%