2018
DOI: 10.1101/380501
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Mapping and Analysis of QTL for Early Maturity Trait in Tetraploid Potato (Solanum tuberosum L.)

Abstract: 16Maturity is one of the important traits of potato. In order to get the genetic segment of potato early maturity trait, 17 a tetraploid potato maturity segregation population of Zhongshu 19 × Zhongshu 3 was used for genetic analysis 18 through the combination of high throughput simplified genome sequencing (2b-RAD) and bulked segregation 19 analysis (BSA). A genetic segment related to the early maturity trait at the 3.7~4.2 Mb locus on the short arm of 20 chromosome 5 was obtained and eight markers were devel… Show more

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Cited by 7 publications
(6 citation statements)
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References 30 publications
(35 reference statements)
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“…The exciton stability results correlated well with the reported device operational lifetime trend (Ir(mphmq) 2 (tmd): 68 824 h (at 1000 cd m −2 ), CdSe: 3 00 000 h (at 100 cd m −2 ), and InP/ZnSe/Zns: 1095 h (at 1000 cd m −2 ). [17][18][19][20]12] To check the stability of InP-QDs, Cd-QDs, and Bebq 2 :Ir(mphmq) 2 (tmd) against hole and electron stress, HODs and EODs were fabricated with the following structures.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The exciton stability results correlated well with the reported device operational lifetime trend (Ir(mphmq) 2 (tmd): 68 824 h (at 1000 cd m −2 ), CdSe: 3 00 000 h (at 100 cd m −2 ), and InP/ZnSe/Zns: 1095 h (at 1000 cd m −2 ). [17][18][19][20]12] To check the stability of InP-QDs, Cd-QDs, and Bebq 2 :Ir(mphmq) 2 (tmd) against hole and electron stress, HODs and EODs were fabricated with the following structures.…”
Section: Introductionmentioning
confidence: 99%
“…The published OLED with Ir(mphmq) 2 (tmd) and QLED with CdZnSeS/ZnS-QDs showed EQE of more than 21% and long lifetime of 68 824 h (at 1000 cd m −2 ) and 3 00 000 h (at 100 cd m −2 ) respectively. [17][18][19][20] Here, the degradation causes of InP-QLED were analyzed to improve its stability. To check the causes of device degradation, we analyzed the stability of InP-QDs against exciton and hole/electron-exciton stress and compared the results with Bebq 2 :Ir(mphmq) 2 (tmd) and Cd-QDs.…”
mentioning
confidence: 99%
“…The results are depicted in Table 2 and Figure S9, Supporting Information. [21][22][23][24][25][26][27][28] For comparison purposes, LT 97 and LT 90 values at an L 0 of 1000 cd m −2 were estimated from the diagram included in the literature and by assuming an acceleration coefficient of 1.7 for all the results listed in Table S9, Supporting Information, in addition to the measured values. To our knowledge, the operational stability of 4(C)-based OLED is the best among those of literature-reported deep red/NIR OLEDs having an emission λ max beyond 650 nm.…”
Section: Electroluminescent Properties Of 1(a) 2(a) 3(c) 4(c) 5 Andmentioning
confidence: 99%
“…This achievement indicates one of the most stable phosphorescent OLEDs amongst previous academic reports. [7,10,[20][21][22][23][24] It is worth noting that aging stability of the NPB:ETM-1 devices was more variational to the HTM:ETM ratios (Figure S5, Supporting Information), suggesting carrier balance and recombination profiles play significant roles on the electrical aging process.…”
Section: Device Performance Of Exciplex Cohosts Based Oledsmentioning
confidence: 99%