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2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) 2015
DOI: 10.1109/nano.2015.7388847
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Manufacturing pathway and experimental demonstration for nanoscale fine-grained 3-D integrated circuit fabric

Abstract: At Sub-20nm technologies CMOS scaling faces severe challenges primarily due to fundamental device scaling limitations, interconnection overhead and complex manufacturing. Migration to 3-D has been long sought as a possible pathway to continue scaling; however, CMOS's intrinsic requirements are not compatible for fine-grained 3-D integration. In [1], we proposed a truly fine-grained 3-D integrated circuit fabric called Skybridge that solves nanoscale challenges and achieves orders of magnitude benefits over CMO… Show more

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Cited by 10 publications
(3 citation statements)
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“…Structure has to be firm and stable in order to apply gate voltage properly. Gate-all-around, monolithic 3D [14], and fine grained vertical 3D [15] like structures may be employed for enabling dense wiring. These are planned for both fabrication and simulation runs for comparison.…”
Section: B Fabrication Plan and Challengesmentioning
confidence: 99%
“…Structure has to be firm and stable in order to apply gate voltage properly. Gate-all-around, monolithic 3D [14], and fine grained vertical 3D [15] like structures may be employed for enabling dense wiring. These are planned for both fabrication and simulation runs for comparison.…”
Section: B Fabrication Plan and Challengesmentioning
confidence: 99%
“…Coaxial routing is enabled by specially configured material structures for insulating oxide and contact metal. Proper materials are chosen and deposited around nanowires to form low-resistivity interconnection between the silicon and the metallic bridge; Details of the contact structure and resistance evaluation are presented in [10].…”
Section: Overview Of Skybridgementioning
confidence: 99%
“…Skybridge [7] is a truly fine-grained 3D IC fabric that uses vertically-stacked gates interconnected in 3D on a template of vertical nanowires to yield orders of magnitude benefits over 2D CMOS. Core fabric aspects including device, circuit-style, connectivity [8], thermal management [9] and pathway of manufacturing [10] are co-architected for 3D compatibility. Input/output pins for each vertically-composed gate have multiple points of access both horizontally and vertically which can be reached through architected routing components, as opposed to T-MI which limits pin-access to a 2D plane and relies on conventional routing schemes.…”
Section: Introductionmentioning
confidence: 99%