1982
DOI: 10.1016/0022-0248(82)90317-7
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Manganese doping of ZnS and ZnSe epitaxial layers grown by organometallic chemical vapour deposition

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Cited by 62 publications
(6 citation statements)
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“…As it is seen in the figure, we have obtained a satisfactory accordance between model and the experiment except point 1 (1wt%). We have not obtained a good agreement using the other data (on τ1 vs. Mn2+ concentration) [1,[3][4][5][6][7][8][9][10]. Our result points out that the proposed method can be applied only when both kinds of manganese centres are excited identically.…”
Section: R O L U M I N E S C E N T T H I N F I L M C E L L S T H E contrasting
confidence: 48%
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“…As it is seen in the figure, we have obtained a satisfactory accordance between model and the experiment except point 1 (1wt%). We have not obtained a good agreement using the other data (on τ1 vs. Mn2+ concentration) [1,[3][4][5][6][7][8][9][10]. Our result points out that the proposed method can be applied only when both kinds of manganese centres are excited identically.…”
Section: R O L U M I N E S C E N T T H I N F I L M C E L L S T H E contrasting
confidence: 48%
“…It is well-known that, generally, manganese in ZnS creates two kind of centres: Mn2 + ions and Mn2 +-Mn2 + pairs [2,3,7,15]. So, we can use the above described method to determine concentration of manganese in our e l e c t…”
Section: Resultsmentioning
confidence: 99%
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“…Compositional changes at the heterojunction interface and within the epitaxial layer were studied by EDAX in a JEOL 1200 EX electron microscope and by SIMS in a Cameca IM3-3F instrument again using conditions detailed in an earlier work [9].…”
Section: Methodsmentioning
confidence: 99%
“…Since the deposition occurs on a molecular scale, layer by layer, the dopants and/or second phase are dispersed uniformly through the material as it grows. For example, manganese doped layers of ZnS and ZnSe have been produced for applications as optoelectronic devices [44]. Also, doping of ZnS and ZnSe with excess zinc, indium or aluminum has been proposed as a technique to obtain conducting layers of ZnS or ZnSe [45,46].…”
Section: General Discussion Of Control Of Materials Propertiesmentioning
confidence: 99%