2021
DOI: 10.1109/tit.2020.3032407
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Managing Device Lifecycle: Reconfigurable Constrained Codes for M/T/Q/P-LC Flash Memories

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Cited by 16 publications
(49 citation statements)
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“…As implied in the introduction, literature works do not strictly agree on the set of forbidden patterns to operate on. Additionally, as the Flash device ages, the set of error-prone patterns is expected to expand [18]. Based on our recent experimental tests on a practical TLC Flash device, we decided to focus on the set characterized as follows.…”
Section: Patterns Mapping and 2d Rr Codingmentioning
confidence: 99%
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“…As implied in the introduction, literature works do not strictly agree on the set of forbidden patterns to operate on. Additionally, as the Flash device ages, the set of error-prone patterns is expected to expand [18]. Based on our recent experimental tests on a practical TLC Flash device, we decided to focus on the set characterized as follows.…”
Section: Patterns Mapping and 2d Rr Codingmentioning
confidence: 99%
“…Coding to eliminate data patterns resulting in consecutive levels (q − 1)0(q − 1) was considered in [16] and [17]. Coding to eliminate data patterns resulting in consecutive levels or level patterns (q − 1)µ(q − 1), for all µ < q − 1, was presented in [15], [17], and [18].…”
Section: Introductionmentioning
confidence: 99%
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