2008
DOI: 10.1007/978-3-540-73612-7_5
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Magnetron Sputtering of ZnO Films

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Cited by 16 publications
(6 citation statements)
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“…Such profiles are an important aspect for magnetron sputtering deposition onto a stationary substrate, since the plasma/ion assistance of the film growth varies radially significantly, caused by the plasma torus which is formed in front of the target [18]. For the deposition of TCO films it is often reported that radial profiles of the resistivity exhibit pronounced maxima or minima opposite the erosion groove of the target which are formed due to the torus-like shape of the magnetron plasma-see, for instance, [18,[64][65][66]. Figure 9 displays the radial distributions of the electrical parameters and the film thickness for DC and RF plasma excitation.…”
Section: Radial Profilesmentioning
confidence: 99%
“…Such profiles are an important aspect for magnetron sputtering deposition onto a stationary substrate, since the plasma/ion assistance of the film growth varies radially significantly, caused by the plasma torus which is formed in front of the target [18]. For the deposition of TCO films it is often reported that radial profiles of the resistivity exhibit pronounced maxima or minima opposite the erosion groove of the target which are formed due to the torus-like shape of the magnetron plasma-see, for instance, [18,[64][65][66]. Figure 9 displays the radial distributions of the electrical parameters and the film thickness for DC and RF plasma excitation.…”
Section: Radial Profilesmentioning
confidence: 99%
“…Deposisi dengan DC magnetron Sputtering menggunakan prinsip medan magnet tertutup untuk mengarahkan atom target bergerak dari katoda menuju anoda. Pada anoda, atom target akan terdeposisi terdeposisi membentuk film tipis sel surya Ag/SiP/SiB[10][11]. Karakterisasi sel surya dilakukan dengan multimeter untuk mendapatkan data arus dan tegangan.…”
unclassified
“…However, because of non-equilibrium nature of the sputtering process, the film properties exhibit a critical dependence on the process parameters, which is evident from the large difference in the technological process windows reported by many researchers for obtaining films of high conductivity and high visible transmittance. [3][4][5][6] Earlier studies have revealed that the sputter-deposited ZnO thin films exhibit the hexagonal wurtzite structure with a predominant c-axis orientation, which is expected on the basis of minimization of surface energy under thermodynamic equilibrium. However, the growth may occur under far from equilibrium conditions, the extent of deviation being determined by the sputtering parameters, and this may lead to substantial effects on structural, electrical and optical properties of the films.…”
mentioning
confidence: 99%