1992
DOI: 10.3379/jmsjmag.16.303
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Magnetoresistance in 82Ni-Fe/Al-Al2O3/Co Junction. Dependence of the Tunneling Conductance on the Angle between the Magnetizations of Two Ferromagnetic Layers.

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Cited by 16 publications
(4 citation statements)
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“…Attempts to apply this artificial tunnel barrier technique to magnetic tunnel junctions, though initially slow to succeed, eventually resulted in demonstrations at room temperature of an effect of the size earlier expected. First, in 1991, Miyazaki and co-workers at Tohoku University reported NiFe/Al-Al 2 O 3 /Co junctions with TMRs of 2.7% at room temperature [23,24]. This was a significantly higher percentage than earlier roomtemperature results, but far lower than expectations.…”
Section: Evolution Of the Magnetic Tunnel Junctionmentioning
confidence: 83%
“…Attempts to apply this artificial tunnel barrier technique to magnetic tunnel junctions, though initially slow to succeed, eventually resulted in demonstrations at room temperature of an effect of the size earlier expected. First, in 1991, Miyazaki and co-workers at Tohoku University reported NiFe/Al-Al 2 O 3 /Co junctions with TMRs of 2.7% at room temperature [23,24]. This was a significantly higher percentage than earlier roomtemperature results, but far lower than expectations.…”
Section: Evolution Of the Magnetic Tunnel Junctionmentioning
confidence: 83%
“…Magnetic-tunnel junctions ͑MTJs͒ are emerging as a new class of magnetoresistive ͑MR͒ devices. [1][2][3][4][5][6][7] MTJs have demonstrated a number of technical advantages over the existing giant magnetoresistance ͑GMR͒ devices. Metallic GMR structures are inherently highly conductive, so a large current density is required to generate enough voltage signal.…”
Section: ͓S0021-8979͑98͒47311-0͔mentioning
confidence: 99%
“…This technique separates the magnetic response of the top electrode from that of the bottom, and enables us to attain saturated antiparallel configurations of the junction. After the deposition, a lithographical patterning procedure was used to fabricate the MTJ devices as small as 1ϫ1 m. 2 The details of this process have been described elsewhere. [5][6][7] The blanket multilayer films are examined by a vibrating-sample magnetometer at room temperature after the deposition.…”
Section: ͓S0021-8979͑98͒47311-0͔mentioning
confidence: 99%
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