2021
DOI: 10.1103/physrevb.104.184514
|View full text |Cite
|
Sign up to set email alerts
|

Magnetoconductance and photoresponse properties of disordered NbTiN films

Abstract: We report on the experimental study of phonon properties and electron-phonon scattering in thin superconducting NbTiN films, which are intensively exploited in various applications. Studied NbTiN films with sub-10-nm thicknesses are disordered with respect to electron transport, the Ioffe-Regel parameter of kFle=2.5-3.0 (kF is the Fermi wave vector, and le is the electron mean free path), the inelastic electron-phonon interaction, and the product qTle1 (qT is the wave vector of a thermal phonon). By means of m… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

5
27
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
5
2

Relationship

4
3

Authors

Journals

citations
Cited by 15 publications
(32 citation statements)
references
References 54 publications
5
27
0
Order By: Relevance
“…These values correspond to the estimated parameters ξ ≈ 5.7 nm and λ ≈ 600 nm for T ≈ 2 K. Extrapolation to T = 0 using BCS theory gives ξ(0) ≈ 5.1 nm and λ(0) ≈ 550 nm [17]. These are consistent with previously reported values for NbTiN films [27,28]. The assumed magnetic offset B off moves the simulation data peak curve slightly closer to zero magnetic field and is needed for a good fit.…”
Section: A Critical Current Dependency On Applied Magnetic Fieldsupporting
confidence: 90%
“…These values correspond to the estimated parameters ξ ≈ 5.7 nm and λ ≈ 600 nm for T ≈ 2 K. Extrapolation to T = 0 using BCS theory gives ξ(0) ≈ 5.1 nm and λ(0) ≈ 550 nm [17]. These are consistent with previously reported values for NbTiN films [27,28]. The assumed magnetic offset B off moves the simulation data peak curve slightly closer to zero magnetic field and is needed for a good fit.…”
Section: A Critical Current Dependency On Applied Magnetic Fieldsupporting
confidence: 90%
“…The strips were fabricated from two NbTiN films with thicknesses 6 and 9 nm, which were studied earlier in [13]. The films were deposited on Si substrates on top of a 270 nm-thick thermally-grown SiO 2 layer.…”
Section: Experiments and Resultsmentioning
confidence: 99%
“…The value of T C was used as a fitting parameter in order to account for an expected reduction of the transition temperature in nanostructures as compared to non-structured films [26]. The best-fit values of T C listed in Table I are indeed slightly smaller than those of non-structured films (8.41 and 9.51 K for films with thicknesses 6 and 9 nm, respectively [13]). At the bath temperature of 3 K, the ratios I C /I dep for our strips are 0.56 (d = 6 nm) and 0.63 (d = 9 nm).…”
Section: Experiments and Resultsmentioning
confidence: 99%
See 2 more Smart Citations