Magneto-optical ellipsometry

Višňovský, Š.

doi:10.1007/bf01597496

Cited by 156 publications

(50 citation statements)

References 41 publications

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“…Using Yeh's matrix formalism [15], we calculated contribution Φ tot and separately both magnetic contributions Φ 1 and Φ 2 to the longitudinal MO Kerr effect at wavelength of incident light 670 nm for angle of incidence varying from 0…”

Section: Resultsmentioning

confidence: 99%

Ellipsometric Selective Sensitivity to Magnetic Nanostructures

et al. 2010

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Recently, we have shown that the approach of depth sensitivity of magneto-optic ellipsometry can be generalized to selectivity from different materials in nanostructures. We use the condition number as the figure of merit to quantify the magneto-optic selectivity to two different magnetic contributions in magnetic nanostructure. The method is demonstrated on nanostructures containing magnetically hard Fe particles in surface layer of soft FeNbB amorphous ribbon. We separated both magnetic contributions from measurement of hysteresis loops using magneto-optic Kerr effect in longitudinal configuration. Magneto-optic selectivity is discussed and theoretical model on the basis of effective medium is compared with experimental data of longitudinal magneto-optic Kerr effect depending on angle of incidence.

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Section: Resultsmentioning

confidence: 99%

Ellipsometric Selective Sensitivity to Magnetic Nanostructures

et al. 2010

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“…We first summarize the 4×4 matrix formalism [3,4] applied here to the description of the MO interactions at normal light incidence in a stack of layers subjected to magnetization perpendicular to the planar interfaces (polar configuration). We consider the structure consisting of N homogeneous layers separated by interface planes z = z n (n = 1, ..., N ) in a Cartesian coordinate system, z n−1 < z n .…”

Section: × 4 Matrix Approachmentioning

confidence: 99%

“…Thanks to an advanced technology these systems display a precisely defined composition profile and their magneto-optical response can be often adequately described by electromagnetic wave theory [2]. The most complete information is provided by the universal 4 × 4 matrix approach [3,4,5] which allows computer simulations without any restriction on the permittivity tensor in the individual layers as well as on the angle of incidence of the optical wave and the number of layers in the system.…”

Section: Introductionmentioning

confidence: 99%

Magneto-optic polar Kerr and Faraday effects in periodic multilayers

Višňovský¹,

Postava²,

Yamaguchi³

2001

Opt. Express

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Magnetooptic (MO) effects in magnetic multilayers with periodically stratified regions are analyzed for the case of normal light wave incidence and polar magnetization (Faraday and polar Kerr effects). From the universal 4 × 4-matrix formalism simplified analytical representations restricted to terms linear in the off-diagonal permittivity tensor elements are obtained with no loss in accuracy. The MO effects are expressed as weighted sums of contributions from individual layers. Approximate expressions useful for the evaluation of trends in MO effects are given for periodic multilayers consisting of blocks with ultrathin magnetic films. The procedure is illustrated on periodic systems built of symmetric units. Limits on the ultrathin approximation are discussed.

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“…We suggest that magneto-optical ellipsometry is a technique that reflects these requirements. Magneto-optical ellipsometry usually combines the features of conventional ellipsometry and of magneto-optical Kerr effect measurements [2][3][4][5][6]. Applied to the sample magnetic field changes the ellipsometric parameters, this difference can be examined and used to investigate magneto-optic properties of the sample.…”

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confidence: 99%