Two-layer Model of Reflective Ferromagnetic Films in Terms of Magneto-optical Ellipsometry Studies

Abstract

An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model of ferromagnetic reflective films is in focus. The obtained algorithm can be used to control optical and magneto-optical properties during films growth inside vacuum chambers.

Multilayered Ferromagnetic Nanostructures Study: Processing Data from Magneto-Ellipsometry Measurements

“…At the moment, a number of works have been carried out in order to develop a set-up for thin-film structures synthesis and their in situ analysis using various models of reflective ferromagnetic nanostructures. Algorithms for solving the inverse magneto-ellipsometry problem for isotropic reflective layered systems with a ferromagnetic layer, described by a model of the homogeneous semi-infinite medium, a single-layer model and a two-layered model, are developed and implemented [8][9][10]. So this study logically continues our previous research in the field of layered nanostructures investigation by means of magneto-ellipsometry technique.…”

Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures

“…In this work, we analyze data that were obtained in the experiment on ferromagnetic Si(substrate)-SiO 2 (buffer layer)-Fe(ferromagnetic layer) nanostructures with different thicknesses of the Fe layer and were processed using the multilayer model of reflecting systems that contains ferromagnetic and nonferromagnetic films on a semi-infinite nonferromagnetic substrate [6] and takes into account the SiO 2 /Fe and Fe/vacuum interfaces. The listed materials were chosen because numerous optical and magneto-optical measurements for them are available for quantitative comparison with our measurements and calculations [3,7,8].…”