2015 Fourth Berkeley Symposium on Energy Efficient Electronic Systems (E3S) 2015
DOI: 10.1109/e3s.2015.7336817
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Magneto-electric magnetic tunnel junction logic devices

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Cited by 15 publications
(20 citation statements)
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“…The most commonly discussed readout mechanism relies on tunneling magnetoresistance (TMR), where the voltagecontrolled FM film constitutes the free layer of the TMR trilayer [1], [22]- [26], [31]- [37]. Problems arise with leakage currents, canted magnetization (as may occur with very high critical temperature MEs), and when scaling to very small dimensions.…”
Section: Introductionmentioning
confidence: 99%
“…The most commonly discussed readout mechanism relies on tunneling magnetoresistance (TMR), where the voltagecontrolled FM film constitutes the free layer of the TMR trilayer [1], [22]- [26], [31]- [37]. Problems arise with leakage currents, canted magnetization (as may occur with very high critical temperature MEs), and when scaling to very small dimensions.…”
Section: Introductionmentioning
confidence: 99%
“…By connecting AFMFET devices in the pull-up and pull-down networks properly, all complementary logic functions can be achieved. The voltage generated at the output is static, which can directly drive the input of the next stage without using auxiliary field-effect transistors or any special clocking schemes as needed in prior magnetoelectric-based device proposals [12].…”
Section: Proposed Logic Implementationmentioning
confidence: 99%
“…From the experimental results in [22], the typical domain size in chromium is about 5 µm, which is more than 10× larger compared to the AFM layer used in this paper. Therefore, a single-domain assumption is expected to be valid, and this property has been used in the past proposals to implement a majority gate based on the MEMTJ device [12], [23]. In these proposals, three input gates are used and the surface magnetization of chromium is controlled by the majority of the inputs.…”
Section: Proposed Logic Implementationmentioning
confidence: 99%
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