Magnetization ripple in ferromagnetic thin films

Leaver, K. D.

doi:10.1016/0040-6090(68)90021-7

Cited by 21 publications

(9 citation statements)

References 43 publications

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“…Hence for typical films the value of Iqvaries between 1.5 and 3 and the A-values calculated according to this model are greater than those obtained by Hoffmann. This is in agreement with the remarks of Leaver [24]. For instance, the wavelength measured by Tsukahara [12] is 6000 A while the value calculated from the model of Hoffmann is 2380 A.…”

Section: E = --( M X H T + M H + M Z H Z ) supporting

confidence: 90%

On the Influence of Surface Roughness on the Magnetization Ripple in Ferromagnetic Thin Films

Maksymowicz¹,

Maksymowicz²,

Lubecka³

1969

Physica Status Solidi (b)

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A model is proposed in which the decisive influence on magnetization ripple is exerted by demagnetizing fields produced by surface charges due to the roughness of the surface of the thin film. The model predicts periodical fluctuations of the magnetization vector around the mean magnetization direction. The expressions obtained for the ripple amplitude and periodicity are where a is the effective value of the surface roughness and t the thickness of the film. The theoretical results are in agreement with the experimental data of other authors.Auf Grund eines Modells wird gezeigt, daB die von der Oberflachenrauhigkeit bewirkten entmagnetisierenden Felder der Oberflachenladungen einen entscheidenden EinfluB auf die Schwankungen der Magnetisierungsrichtung haben. Aus diesem Model1 folgen periodische Schwankungen der Magnetisierungsrichtungen um die Richtung der mittleren Magnetisierung sowie die Werte der Schwankungslange und Amplitude, die durch mit q=-1 n a + M Z F 1 4 n p , 8 A gegeben sind. a ist hierbei der effektive Wert der Oberflachenrauhigkeit und t die Dicke der Schicht. Die erhaltenen theoretischen Ergebnisse sind in obereinstimmung mit MeBdaten anderer Autoren.

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Section: E = --( M X H T + M H + M Z H Z ) supporting

confidence: 90%

On the Influence of Surface Roughness on the Magnetization Ripple in Ferromagnetic Thin Films

Maksymowicz¹,

Maksymowicz²,

Lubecka³

1969

Physica Status Solidi (b)

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“…Likewise, the residual film thickness is large as to neglect the relevance of a magnetization ripple state. 40 Thus, our samples can be well described by a uniform magnetization throughout the film thickness. Schl€ omann calculated the in-plane demagnetizing field of such a magnetic film with an arbitrarily rough surface: on the assumption that the film surface is not too ragged, a periodic ripple profile with rms surface roughness x RMS and wavelength K leads to the following formula for the uniaxial in-plane anisotropy field…”

Section: Magnetostatic Properties: Coercivity and Uniaxial Magnetimentioning

confidence: 71%

On the limits of uniaxial magnetic anisotropy tuning by a ripple surface pattern

Arranz

Colino

Palomares

2014

Journal of Applied Physics

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Ion beam patterning of a nanoscale ripple surface has emerged as a versatile method of imprinting uniaxial magnetic anisotropy (UMA) on a desired in-plane direction in magnetic films. In the case of ripple patterned thick films, dipolar interactions around the top and/or bottom interfaces are generally assumed to drive this effect following Schlömann's calculations for demagnetizing fields of an ideally sinusoidal surface [E. Schlömann, J. Appl. Phys. 41, 1617 (1970)]. We have explored the validity of his predictions and the limits of ion beam sputtering to induce UMA in a ferromagnetic system where other relevant sources of magnetic anisotropy are neglected: ripple films not displaying any evidence of volume uniaxial anisotropy and where magnetocrystalline contributions average out in a fine grain polycrystal structure. To this purpose, the surface of 100 nm cobalt films grown on flat substrates has been irradiated at fixed ion energy, fixed ion fluency but different ion densities to make the ripple pattern at the top surface with wavelength Λ and selected, large amplitudes (ω) up to 20 nm so that stray dipolar fields are enhanced, while the residual film thickness t = 35–50 nm is sufficiently large to preserve the continuous morphology in most cases. The film-substrate interface has been studied with X-ray photoemission spectroscopy depth profiles and is found that there is a graded silicon-rich cobalt silicide, presumably formed during the film growth. This graded interface is of uncertain small thickness but the range of compositions clearly makes it a magnetically dead layer. On the other hand, the ripple surface rules both the magnetic coercivity and the uniaxial anisotropy as these are found to correlate with the pattern dimensions. Remarkably, the saturation fields in the hard axis of uniaxial continuous films are measured up to values as high as 0.80 kG and obey a linear dependence on the parameter ω2/Λ/t in quantitative agreement with Schlömann's prediction for a surface anisotropy entirely ruled by dipolar interaction. The limits of UMA tuning by a ripple pattern are discussed in terms of the surface local angle with respect to the mean surface and of the onset of ripple detachment.

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“…1͑b͒ with the magnetic field parallel (Ϫ᭺Ϫ) and perpendicular (Ϫ᭹Ϫ) to H A is consistent with a reversal occurring through the appearance of ripples do-main structures. 13 When the value of the field applied along the easy axis is reduced from positive saturation to zero, magnetization rotates continuously in the film plane in a reversible process and a component perpendicular to H A appears. The magnetic moments are then aligned within an angle bisected by the direction of the positive saturation field.…”

Section: Magnetization Curves and Reversal In The Soft And Hard mentioning

confidence: 99%

Tunneling magnetoresistance and induced domain structure inAl2O3-based junctions

et al. 2000

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Magnetization reversal in sputtered Co and oxidized Co ͑CoOx͒ layers are studied using transport measurements and magneto-optic Kerr effect. When associated in a magnetic tunnel junction, the two magnetic layers show a strong ferromagnetic coupling. Using the tunnel magnetoresistive effect as a probe for micromagnetic studies, we show the existence of an unexpected domain structure in the soft Co layer. This domain structure originates from the duplication of the domain structure of the hard CoOx magnetic layer template into the soft Co layer via the ferromagnetic coupling.

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Magnetization ripple in ferromagnetic thin films

Cited by 21 publications

References 43 publications

On the Influence of Surface Roughness on the Magnetization Ripple in Ferromagnetic Thin Films

On the Influence of Surface Roughness on the Magnetization Ripple in Ferromagnetic Thin Films

On the limits of uniaxial magnetic anisotropy tuning by a ripple surface pattern

Tunneling magnetoresistance and induced domain structure inAl2O3-based junctions

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