Magnetic properties of planar arrays of Fe-nanowires grown on oxidized vicinal silicon (111) templates

Magnetic and resonance properties of Fe nanowire arrays on oxidised step-bunched silicon templates

“…They are usually realized using bottom-up methods, such as reactive epitaxy [9,10] and shallow angle deposition [11,12] providing faster throughput and improved physical characteristics of these objects (better structural homogeneity, enhanced magnetism, etc.) compared to some other fabrication methods [12][13][14]. At the same time, the forward plan for use of magnetic nanowires in emerging technologies requires a comprehensive understanding of their physical properties.…”

“…However, the use of an innovative shallow angle deposition method called ATLAS (Atomic Terrace Low Angle Shadowing) [12][13][14] allows controlled growth of magnetic nanostructures on highly periodic step-bunched templates that are thick and uniform enough to exhibit ferromagnetism at RT. In…”

Structural and magnetic properties of planar nanowire arrays of Co grown on oxidized vicinal silicon (111) templates

“…13,14 For topographical investigations we prepared Co-NW arrays without cap layer, whereas for magnetization and transmission electron microscopy (TEM) studies, the arrays were capped with a 5 nm MgO layer. The templates were oxidized at 830 o C for a duration of 15 h producing a 110 nm thick amorphous surface oxide layer.…”

“…It has been demonstrated that by using shallow angle deposition one can overcome SPM as it enables controlled growth of magnetic nanostructures that are thick enough to exhibit ferromagnetism at room temperature. 11,12 We make use of the atomic terrace low angle shadowing (ATLAS) technique 12,13 to grow several nm thick Co-NW arrays on oxidized step-bunched Si templates. Here, we report on the structural and magnetic properties of planar NW arrays of Co with varying wire widths (25-70 nm) grown on oxidized step bunched Si surfaces by means of the ATLAS method.…”

“…Details of the ATLAS method are given elsewhere. 12,13 The topography characterization of the templates and NW arrays was performed using a scanning electron microscope (SEM, Zeiss Ultra) and atomic force microscope (AFM Solver Pro, NT MDT). For structural studies we used a high resolution transmission electron microscope (HRTEM, FEI Tecnai F30) operated at 300 kV.…”