2014
DOI: 10.1209/0295-5075/107/57009
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Magnetic ordering in Cr-doped Bi 2 Se 3 thin films

Abstract: We report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. Highresolution XRD shows the exceptionally high crystalline quality of the doped films with no parasitic phases up to a Cr concentration of 12% (in % of the Bi sites occupied by substitutional Cr). The magnetic moment, measured by SQUID magnetometry, was fo… Show more

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Cited by 61 publications
(60 citation statements)
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“…Measuring the unoxidized interior of the film, we show unequivocally that Cr enters the host matrix as nominally Cr 2+ , matching very closely the calculated multiplet structure of the spectra. Using the method of Arrott plots [18], where the isothermal magnetization is measured by XMCD as a function of field, we find a T C of (7 ± 1) K, comparable to previous bulk-sensitive magnetometry measurements on the same films [15]. After in-situ evaporation of a ferromagnetic thin film of Co onto the cleaved surface at low temperatures, we find a clean interface with no evidence of alloying or any distortion of the XMCD spectra.…”
supporting
confidence: 82%
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“…Measuring the unoxidized interior of the film, we show unequivocally that Cr enters the host matrix as nominally Cr 2+ , matching very closely the calculated multiplet structure of the spectra. Using the method of Arrott plots [18], where the isothermal magnetization is measured by XMCD as a function of field, we find a T C of (7 ± 1) K, comparable to previous bulk-sensitive magnetometry measurements on the same films [15]. After in-situ evaporation of a ferromagnetic thin film of Co onto the cleaved surface at low temperatures, we find a clean interface with no evidence of alloying or any distortion of the XMCD spectra.…”
supporting
confidence: 82%
“…The films are of high crystalline quality and free of secondary phases [15] and Cr clusters [14]. The c-axis lattice constant remains virtually unchanged for the doped films as compared to Bi 2 Se 3 , supporting the finding of substitutional doping, obtained from extended x-ray absorption fine structure (EXAFS) [14].…”
supporting
confidence: 61%
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