Magnetic Microstructure and Media Noise of Thin Film Media Fabricated under Ultra Clean Sputtering Process

Abstract

The media noise performance is discussed in connection with magnetic microstructure for Co based thin film media fabricated under UC process. Results are summarized, (1) The value of SIN m increases by reducing the dispersion of magnetic filed strength at transition, (2) The dispersion of magnetic field strength at transition is suppressed by the reduction of magnetic cluster size, and (3) The grain size reduction and the decrement of intergranular magnetic coupling play an important role for the improvement of recording performance though the reduction of magnetic cluster size.