Frontiers in Optics + Laser Science APS/DLS 2019
DOI: 10.1364/fio.2019.jw3a.89
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Magnetic imaging of malarial nanocrystals with diamond sensors

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Cited by 5 publications
(8 citation statements)
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“…1) is caused by simultaneous effects of the stresses in a hosting NV centers diamond crystals, the bias magnetic field, stray magnetic fields, and temperature shift. The magnetic field effects could be separated by measuring both frequencies f + and f − which are shifted by approximately equal amounts in opposite directions [34,35]. The shift of f + and f − by equal amounts in the same direction (common shift) is then caused by changes in local temperature and stresses.…”
Section: A Detection Principlementioning
confidence: 99%
“…1) is caused by simultaneous effects of the stresses in a hosting NV centers diamond crystals, the bias magnetic field, stray magnetic fields, and temperature shift. The magnetic field effects could be separated by measuring both frequencies f + and f − which are shifted by approximately equal amounts in opposite directions [34,35]. The shift of f + and f − by equal amounts in the same direction (common shift) is then caused by changes in local temperature and stresses.…”
Section: A Detection Principlementioning
confidence: 99%
“…Solid-state spin systems have transitioned from physics demonstrations to promising quantum sensors [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] as performance has improved through materials engineering [17][18][19][20][21][22][23][24][25], coherent control [26][27][28][29][30][31][32][33][34][35], and novel readout [36][37][38][39][40][41][42][43]. While performance now rivals atomic-based sensors [44][45][46][47][48][49], solid-state systems still maintain much of the complexity of their atomic counterparts …”
Section: Introductionmentioning
confidence: 99%
“…Spin-state manipulation with a stateselective microwave (MW) pulse, combined with spindependent fluorescence has been utilized for spectroscopic measurement of magnetic field. Fabrication of a dense ensemble of NV centers [3][4][5][6] allows these measurements to be applied in wide-field imaging modality [7][8][9][10], and local current characterizations using NV center have been achieved [11][12][13][14][15][16]. Wide-field imaging using NV center paves the way for inductive inspection [17,18], which is still challenging with micron-scale resolution by established methods.…”
Section: Introductionmentioning
confidence: 99%