1987
DOI: 10.1063/1.97800
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Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

Abstract: We describe a new method for imaging magnetic fields with 1000 Å resolution. The technique is based on using a force microscope to measure the magnetic force between a magnetized tip and the scanned surface. The method shows promise for the high-resolution mapping of both static and dynamic magnetic fields.

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Cited by 1,121 publications
(480 citation statements)
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“…In the MFM mode, the cantilever is mechanically driven by a piezoelectric transducer near its resonant frequency f 0 and kept at a constant height Dh above the surface. When the tip is placed in proximity to a sample, the cantilever's resonant motion is altered in ways that can be traced directly to the force gradient qF z /qz, which in turn produces changes in the amplitude DA, phase Df and frequency Df of the cantilever resonance 26,29 :…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…In the MFM mode, the cantilever is mechanically driven by a piezoelectric transducer near its resonant frequency f 0 and kept at a constant height Dh above the surface. When the tip is placed in proximity to a sample, the cantilever's resonant motion is altered in ways that can be traced directly to the force gradient qF z /qz, which in turn produces changes in the amplitude DA, phase Df and frequency Df of the cantilever resonance 26,29 :…”
Section: Resultsmentioning
confidence: 99%
“…In this article we investigate magnetism at the LAO/STO interface using magnetic force microscopy (MFM) 26 . By using top-gated LAO/STO heterostructures we are able to search for magnetism as a function of mobile interfacial carrier density.…”
mentioning
confidence: 99%
“…This stimulated the measurement of magnetic [7][8][9][10] and electrostatic forces [11][12][13] and led to the development of magnetic force, electric force, and Kelvin probe microscopy [14]. The goal was not so much to understand the force but to image the distribution of magnetization, charge, or surface potential, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…The results obtained are often dependant on the volume of the sampled region, and thus in many cases the volume fraction of each phase measured will differ between techniques. Magnetic force microscopy (MFM) is a variant of atomic force microscopy (AFM) [12] which uses a magnetic probe tip to map in 2D the distribution of the magnetic domains present at the surface of a specimen [13,14]. As ferrite is ferromagnetic, and austenite and sigma phase are paramagnetic [15,16], it is possible to use this magnetic interaction to differentiate between the phases.…”
Section: Introductionmentioning
confidence: 99%