Magnetic field and force analysis of high T/sub c/ superconductor with flux flow and creep

Yoshida, Yamato; Uesaka, Mitsuru; Miya, Kenzo

doi:10.1109/20.312694

Cited by 108 publications

(63 citation statements)

References 5 publications

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“…By solving the initial-boundary-value problem of (4), we can determine the time evolution of the scalar function S (x, t). Once S (x, t) is determined at each time, the shielding current density j(x, t) can be easily evaluated by using (1). Apparently, the above method for calculating j(x, t) is unaffected by the existence of cracks or holes.…”

Section: Governing Equationmentioning

confidence: 99%

See 1 more Smart Citation

Accurate and Stable Numerical Method for Analyzing Shielding Current Density in High-Temperature Superconducting Film Containing Cracks

Kamitani

Takayama

Saitoh³

et al. 2012

Plasma and Fusion Research

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A numerical method is proposed for analyzing the shielding current density in a high-temperature superconducting (HTS) film containing cracks/holes. If an HTS film contains cracks or holes, an integral form of Faraday's law is also imposed as the boundary condition. Since the integral form can be completely incorporated into the weak form, it is regarded as the natural boundary condition. Thus, the weak form has only to be solved with the essential boundary conditions. However, the resulting numerical solution does not satisfy the integral form exactly. In order to resolve this problem, the following method is proposed: virtual voltages be applied along the surfaces of cracks and holes so as to have Faraday's law numerically satisfied. By using the proposed method, the influence of a crack on the permanent magnet method is investigated numerically.

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Section: Governing Equationmentioning

confidence: 99%

“…Since the evaluation of the shielding current density is indispensable for the design of engineering applications, several numerical methods [1][2][3] have been so far proposed to calculate the shielding current density. However, almost all of them can be applied only to an HTS sample containing neither a hole nor a crack.…”

Section: Introductionmentioning

confidence: 99%

Accurate and Stable Numerical Method for Analyzing Shielding Current Density in High-Temperature Superconducting Film Containing Cracks

Kamitani

Takayama

Saitoh³

et al. 2012

Plasma and Fusion Research

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show abstract

“…In general, HTS films have a strong anisotropy in the critical current density [1]: its component along the c-axis is negligibly small as compared with that parallel to the a-b plane. In order to take the anisotropy into account, we set the following two assumptions:…”

Section: Multiple Thin-layer Approximationmentioning

confidence: 99%

“…By assuming the thin-plate approximation, Yoshida et al [1] derived the governing equation of the shielding current density in an HTS film. However, the resulting equation contains z (a coordinate in the thickness direction) as a parameter so that its solution has z-dependence.…”

Section: Introductionmentioning

confidence: 99%

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Numerical Method for Analyzing Shielding Current Density in HTS Film with Multiple-Layer/Multiply-Connected Structure

Kamitani

Takayama

Ikuno

et al. 2013

Plasma and Fusion Research

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The governing equations of the shielding current density j in a high-temperature superconducting film are formulated for the case where the film contains cracks or holes. Since the derived equations cannot be solved only with the boundary condition j · n = 0 on the film surface, additional conditions are also derived. A numerical method is proposed for solving the initial-boundary-value problem of the equations and its performance is evaluated by means of the numerical simulation of the permanent magnet method.

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Behavior Laws of Materials

Bouillault¹,

Kedous‐Lebouc²,

Meunier³

et al. 2008

The Finite Element Method for Electromagnetic Modeling

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Magnetic field and force analysis of high T/sub c/ superconductor with flux flow and creep

Cited by 108 publications

References 5 publications

Accurate and Stable Numerical Method for Analyzing Shielding Current Density in High-Temperature Superconducting Film Containing Cracks

Accurate and Stable Numerical Method for Analyzing Shielding Current Density in High-Temperature Superconducting Film Containing Cracks

Numerical Method for Analyzing Shielding Current Density in HTS Film with Multiple-Layer/Multiply-Connected Structure

Behavior Laws of Materials

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