Today, Fs defects in MgO as isolated
surface neutral oxygen vacancies
are in the focus of surface science, catalysis research, and emission
coating of microchannel plates. With the 10–4 atom
% content at 750 K and under p
O2
= 10–9 Torr, estimated by us from the known equilibrium T–x and p–T–x diagrams of MgO, Fs defects
remain invisible or difficult-to-detect objects. The MgO(100) →
MgO(100) + Fs + 1/2O2 phase transition
was studied in MgO films deposited by the metal–organic chemical
vapor deposition (MOCVD) procedure from the mixed-ligand Mg precursor
on Si substrates at 725 K in the O2 flow where the nonstoichiometric
phase (MgO/Fs) is formed in the gas medium containing simultaneous
H2, CO, H2O, CO, and O2 species in
unbalanced concentrations. Realization of the above transition was
proven theoretically and experimentally through kinetic–thermodynamic
analysis of the nonequilibrium system with revealing thermodynamic
motive forces, i.e., the positive enthalpy and entropy, as well as
through a new combination of diagnostic methods including the original
differential dissolution method, due to which separate determination
of the point and morphological defects was achieved. It was found
that Fs defects occur when oxygen in the immediate vicinity to the
substrate surface is replaced practically completely by the oxidized
products of the precursor and the resulting oxygen pressure becomes
enough for this process. The 90 mass % of the as-deposited MgO-film-involved
(MgO/Fs) phase; its chemical activity is demonstrated through dissolution
in hot water, while the electron donor activity is through 9 at 750
eV secondary electron yield. A good understanding of gas-phase reactions
between the precursors and oxygen provides the fundamental basis of
the MOCVD process to deposit MgO films that are dense, free from carbon,
and of homogeneous texture. This makes the MOCVD process suitable
also for use as coatings of microchannel plates.