&lt;title&gt;X-ray polycapillary characterization and 3D imaging properties&lt;/title&gt;

Hampai, D.; Cappuccio, G.; Cibin, Giannantonio; Dabagov, S.B.; Sessa, V.

doi:10.1117/12.742076

Cited by 4 publications

(5 citation statements)

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“…This result can be also validated by the theory presented in [10,11] and in other ray tracing code simulation [5]. In these works the ray optics case is studied for a point source placed on the axis of the channel, but the same theory can be applied for different source positions according with FEM simulation and experimental results.…”

Section: Resultsmentioning

confidence: 81%

“…During the development of polycapillary optics both technology and applied tools an important role has been played by the mathematical modeling and simulation of the radiation propagation behavior inside the channels [5]. The channeling phenomenon through polycapillary optics depends on many variables and, therefore, every model focuses only on some of these parameters [6,7].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

On X-ray channeling in a vibrating capillary

Liedl¹,

Dabagov

Hampai

et al. 2015

Nuclear Instruments and Methods in Physics Research Section B:

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Section: Resultsmentioning

confidence: 81%

Section: Introductionmentioning

confidence: 99%

On X-ray channeling in a vibrating capillary

Liedl¹,

Dabagov

Hampai

et al. 2015

Nuclear Instruments and Methods in Physics Research Section B:

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“…However, the above technologies have certain limitations in the failure analysis and location of SiP devices. For example, the resolution of the 2D/3D X-ray technology, optical emission technique and microscopic infrared thermal imaging detection technology is poor (Hampai et al , 2007; Zhang et al , 2019; Muller et al , 2016); the scanning acoustic microscopy may not work for the complex stacked SiP devices (Wang et al , 2021). The high price and complex operation also limit the application of the magnetic micro defect localization techniques to SiP devices (Gaudestad et al , 2015).…”

Section: Introductionmentioning

confidence: 99%

A failure location technology for SiP devices based on TDR nondestructive testing method

Xiao

Guo²,

Chen³

et al. 2023

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Purpose Traditional nondestructive failure localization techniques are increasingly difficult to meet the requirements of high density and integration of system in package (SIP) devices in terms of resolution and accuracy. Time domain reflection (TDR) is recognized as a novel positioning analysis technology gradually being used in the electronics industry because of the good compatibility, high accuracy and high efficiency. However, there are limited reports focus on the application of TDR technology to SiP devices. Design/methodology/approach In this study, the authors used the TDR technique to locate the failure of SiP devices, and the results showed that the TDR technique can accurately locate the cracking of internal solder joints of SiP devices. Findings The measured transmission rate of electromagnetic wave signal was 9.56 × 107 m/s in the experimental SiP devices. In addition, the TDR technique successfully located the failure point, which was mainly caused by the cracking of the solder joint at the edge of the SiP device after 1,500 thermal cycles. Originality/value TDR technology is creatively applied to SiP device failure location, and quantitative analysis is realized.

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“…The combination of polycapillary lens and fine focused micro X-ray tube (with a source spot size less than 50 µm in diameter) can provide the high intensity radiation flux on a sample necessary to perform a very high-resolution imaging. In comparison to a pinhole [11], an optimized "X-ray source-optics" system can result in radiation density gain (the ratio of X-ray intensities with and without the optics at the focal spot) of more than 3 orders of magnitude [12,13].…”

mentioning

confidence: 99%

“…The possibility to get a very little blurring effect due to rather small radiation divergence behind the optics avoid diffraction effects on the sample edges, i.e., far from a wave zone, as well as multiple scattering radiation in matter. The first microscope designed at LNF [13,15] consists of an X-ray source, a semi-lens and a CCD detector.…”

mentioning

confidence: 99%

High-resolution X-ray imaging by polycapillary optics and lithium fluoride detectors combination

Hampai

Dabagov

Ventura³

et al. 2011

EPL

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Novel results on high-resolution X-ray imaging by a table-top laboratory system based on lithium fluoride (LiF) imaging radiation detectors and a X-ray tube combined with polycapillary optics are reported for the first time. In this paper, imaging experiments of reference objects, as well as thick geological samples, show some of the potentialities of this approach for the development of a compact laboratory X-ray microscopy apparatus. The high spatial resolution and dynamic range of versatile LiF imaging detectors, based on optical reading of photoluminescence from X-ray-induced color centers in LiF crystals and films, allow us to use very simple contact imaging techniques. Promising applications can be foreseen in the fields of bio-medical imaging diagnostics, characterization of X-ray sources and optical elements, material science and photonics.

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<title>X-ray polycapillary characterization and 3D imaging properties</title>

Cited by 4 publications

References 0 publications

On X-ray channeling in a vibrating capillary

On X-ray channeling in a vibrating capillary

A failure location technology for SiP devices based on TDR nondestructive testing method

High-resolution X-ray imaging by polycapillary optics and lithium fluoride detectors combination

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