Abstract:Color can play a very important role in the in-process, in-situ inspection of integrated circuit structures. Optical interference effects caused by thin films give colors that are characteristic of film thicknesses. For these optically transparent thin films (such as silicon dioxide) that make up the IC structures, interference effects take place when white light impinges upon the wafer. As a result, the features on an IC wafer are inherently colorful. We take advantage of this color dimension in our automated… Show more
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