&lt;title&gt;Phase 1: analysis of Spectralon material for use in on-board calibration systems for the medium resolution imaging spectrometer (MERIS)&lt;/title&gt;

Petroy, S. B.; Leland, James E.; Chommeloux, Beatrice; Bruegge, Carol J.; Gourmelon, Georges

doi:10.1117/12.188121

Cited by 5 publications

(5 citation statements)

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“…Overall, UV light exposure degrades the Spectralon reflectance more than the proton exposure for wavelength greater than 0.4 µm. Other experiments [14][15][16][17][18][19] also show similar magnitude of reflectance degradation after exposure to UV radiation. Recent experiment in [20] studied changes in the reflectance properties of pressed and sintered PTFE diffusers induced by exposure to VUV irradiation before and after controlled contamination with Pennzane.…”

Section: A3 Radiation Exposure Experiments On Sd Materialsmentioning

confidence: 68%

“…The SD is made of Spectralon TM (Fluorocarbon-based polymer) and designed to have the property of Lambertian reflectance (see Appendix A.1.). The spectral properties of SD reflectance inevitably degraded due to UV exposure and particle radiations in space [13][14][15][16][17][18][19][20], which are summarized in Appendixes A.2. and A.3.…”

Section: Model On Spectrally-dependent Scattering Over Rough Surfacesmentioning

confidence: 99%

“…Extensive experiments of particle and UV irradiation on SD material were performed [13][14][15][16][17][18][19][20] to study changes in directional-hemispheric spectral reflectance, the bidirectional spectral reflectance factor and the polarization properties of diffuser material after the radiation exposure. In early experiment of [13], optical-grade Spectralon material underwent proton exposure and UV-irradiation.…”

Section: A3 Radiation Exposure Experiments On Sd Materialsmentioning

confidence: 99%

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Spectral Dependent Degradation of the Solar Diffuser on Suomi-NPP VIIRS Due to Surface Roughness-Induced Rayleigh Scattering

2016

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Abstract:The Visible Infrared Imaging Radiometer Suite (VIIRS) onboard Suomi National Polar Orbiting Partnership (SNPP) uses a solar diffuser (SD) as its radiometric calibrator for the reflective solar band calibration. The SD is made of Spectralon™ (one type of fluoropolymer) and was chosen because of its controlled reflectance in the Visible/Near-Infrared/Shortwave-Infrared region and its near-Lambertian reflectance property. On-orbit changes in VIIRS SD reflectance as monitored by the Solar Diffuser Stability Monitor showed faster degradation of SD reflectance for 0.4 to 0.6 µm channels than the longer wavelength channels. Analysis of VIIRS SD reflectance data show that the spectral dependent degradation of SD reflectance in short wavelength can be explained with a SD Surface Roughness (length scale << wavelength) based Rayleigh Scattering (SRRS) model due to exposure to solar UV radiation and energetic particles. The characteristic length parameter of the SD surface roughness is derived from the long term reflectance data of the VIIRS SD and it changes at approximately the tens of nanometers level over the operational period of VIIRS. This estimated roughness length scale is consistent with the experimental result from radiation exposure of a fluoropolymer sample and validates the applicability of the Rayleigh scattering-based model. The model is also applicable to explaining the spectral dependent degradation of the SDs on other satellites. This novel approach allows us to better understand the physical processes of the SD degradation, and is complementary to previous mathematics based models.

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Section: A3 Radiation Exposure Experiments On Sd Materialsmentioning

confidence: 68%

Section: Model On Spectrally-dependent Scattering Over Rough Surfacesmentioning

confidence: 99%

Section: A3 Radiation Exposure Experiments On Sd Materialsmentioning

confidence: 99%

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Spectral Dependent Degradation of the Solar Diffuser on Suomi-NPP VIIRS Due to Surface Roughness-Induced Rayleigh Scattering

2016

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“…Spectralon® reflectance at the blue end of the spectrum is known to degrade due to exposure to UV. This has been observed both in ground exposures ( [9][10]) as well as on orbit ( [11][12][13] [14][15] [16]). The degradation, which is a function of the trace organics and exposure, varies from panel to panel depending on the contamination.…”

Section: Introductionmentioning

confidence: 86%

JPSS J2 Spectralon performance pre-launch

Murgai,

Butler,

Xiong

2023

Earth Observing Systems XXVIII

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Spectralon® is a high reflectance excellent diffuser used to reflect sunlight for use as a calibrator for on-orbit and ground instruments. Radiometric calibration of the reflective bands in the 0.4 to 2.5m wavelength range is performed by measuring the sunlight reflected from Spectralon®. Reflected sunlight is directly proportional to the Bidirectional Reflectance Distribution Function (BRDF) of the Spectralon®. On-orbit exposure to sunlight results in solarization due to solar UV and the presence of residual contamination. Spectralon® quality is checked at start of build by measuring the change in reflectance on exposing a witness sample to 100 hours Solar UV as an indication of on orbit performance. For JPSS J2, the witness samples accompanied the sensor till 30 days before launch. Measuring the reflectance change on exposure to Solar UV of the witness samples accompanying the sensor through build and test is a better indication of on orbit performance as this includes any additional contamination during the build and test phase.

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“…The results of the BRDF of the JPSS flight J1 Spectralon ® panel measured pre-launch at Raytheon have been reported previously. [1] Based on the results of both laboratory testing [2][3] [4] and from analysis of on-orbit MODIS (Terra and Aqua) and Suomi NPP (VIIRS) [5] mission data, Spectralon ® reflectance / BRDF is known to experience spectrally variable degradation increasing over time on orbit (with the maximum degradation occurring at the blue end of the wavelength range) due to the presence of contaminants and exposure to solar UV.…”

Section: Introductionmentioning

confidence: 99%

JPSS-1 VIIRS solar diffuser stability monitor response versus sun angle of incidence

Murgai

Nelson

et al. 2015

Earth Observing Systems XX

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The Visible/Infrared Imaging Radiometer Suite (VIIRS) is a key sensor on the Suomi National Polar-orbiting Partnership (NPP) satellite in orbit as well as for the upcoming Joint Polar Satellite System (JPSS). VIIRS collects Earth radiometry and imagery in 22 spectral from 0.4 to 12.5 μm. Radiometric calibration of the reflective bands in the 0.4 to 2.5 μm wavelength range is performed by measuring the sunlight reflectance from Solar Diffuser Assembly (diffuser is Spectralon®). Spectralon® is known to solarize due to sun UV exposure at the blue end of the spectrum (~0.4 -0.6+ μm) as seen by laboratory tests as well as on orbit data from MODIS and NPP. VIIRS uses a Solar Diffuser Stability Monitor (SDSM) to monitor the change in the Solar Diffuser reflectance in the 0.4 -0.94 μm wavelength range to correct the calibration constants. The SDSM measures the ratio of sun light reflecting from the Solar Diffuser to a direct view of the sun. As the intensity of the light reaching the SDSM in both Solar Diffuser view and sun view is a function of the sun's angle of incidence (AOI), the SDSM response to sun AOI has to be characterized. This paper presents details of the test setup including an extended collimated source simulating the sun across all SDSM bands. The prelaunch characterization results for the JPSS-1 (J1) VIIRS SDSM are presented. Comparison with NPP on orbit yaw maneuver SDSM results shows similar behavior demonstrating that the J1 test successfully characterized the SDSM response to sun AOI.

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<title>Phase 1: analysis of Spectralon material for use in on-board calibration systems for the medium resolution imaging spectrometer (MERIS)</title>

Cited by 5 publications

References 0 publications

Spectral Dependent Degradation of the Solar Diffuser on Suomi-NPP VIIRS Due to Surface Roughness-Induced Rayleigh Scattering

Spectral Dependent Degradation of the Solar Diffuser on Suomi-NPP VIIRS Due to Surface Roughness-Induced Rayleigh Scattering

JPSS J2 Spectralon performance pre-launch

JPSS-1 VIIRS solar diffuser stability monitor response versus sun angle of incidence

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