2000
DOI: 10.1117/12.391724
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<title>Overview of advances in high-performance ROIC designs for use with IRFPAs</title>

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Cited by 10 publications
(3 citation statements)
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“…Other direction is use photoresistors with variable currant photosensivity. As it is seen from the following Si(e/hu)uE/L (8) Where hD -energy of photons; r and G -quantum efficiency and internal amplification factor of the photoresistive detector; and rr -product of main current carriers mobility for their life time, E -strength of an electric field, Ldistance between contacts.…”
Section: Sensitivity Non-uniformity Of Photodetector Cellsmentioning
confidence: 99%
“…Other direction is use photoresistors with variable currant photosensivity. As it is seen from the following Si(e/hu)uE/L (8) Where hD -energy of photons; r and G -quantum efficiency and internal amplification factor of the photoresistive detector; and rr -product of main current carriers mobility for their life time, E -strength of an electric field, Ldistance between contacts.…”
Section: Sensitivity Non-uniformity Of Photodetector Cellsmentioning
confidence: 99%
“…Following this, the newly developed readouts will enter the class of special-purpose processors. It is such advanced readout processors that will largely enhance the performance and functionability of next-generation IR FPAs [3].…”
Section: Introductionmentioning
confidence: 99%
“…CMOS technology scaling has enabled the integration of analog and digital processing in the focal plane down to the pixel level. New architectures that take advantage of such integration to enhance image sensor performance have been developed (e.g., [1,2]). An example is the Digital Pixel Sensor, where digitization is performed at the pixel-level providing ultra high speed and dynamic range imaging capabilities.…”
Section: Introductionmentioning
confidence: 99%