1995
DOI: 10.1117/12.224099
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<title>Low-noise ion source for the implementation of Jet-REMPI: novel on-line monitor for process control</title>

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Cited by 4 publications
(5 citation statements)
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“…Ions formed from photoelectrons are essentially trapped within this electrode. Again, more details are reported in (Oser et al, a, 1995).…”
Section: Noise Reduction Through Minimization Of Surface Effectsmentioning
confidence: 98%
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“…Ions formed from photoelectrons are essentially trapped within this electrode. Again, more details are reported in (Oser et al, a, 1995).…”
Section: Noise Reduction Through Minimization Of Surface Effectsmentioning
confidence: 98%
“…The special design of our ion source is briefly described in the next two sections and in a more detailed account in a paper to be published elsewhere (Oser et al, a, 1995) …”
Section: Experimental General Approach: Rempi-msmentioning
confidence: 99%
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“…For example, Oser et al developed a cone-shaped ion source arrangement, instead of the conventional one that uses parallel plates. 22,33,34 The sensitivity was increased by shifting the ionization regime to the vicinity of the valve. Moreover, ion-electron reactions were minimal, resulting in a low fragmentation.…”
Section: ·1 Sample Inlet Systemmentioning
confidence: 99%