<title>Goniometric optical scatter instrument for bidirectional reflectance distribution function measurements with out-of-plane and polarimetry capabilities</title>

Abstract

A goniometric optical scatter instrument has been developed at the National Institute of Standards and Technology which can readily perform out-of-plane measurements of optical scatter as well as polarimetric measurements. This paper uses the description of this instrument as a platform to discuss key issues that must be addressed when developing either out-of-plane measurement capabilities or polarimetric capabilities, or both at the same time. The transformation from the sample coordinates to the instrument coordinates has been carried out, including the rotation of the polarization coordinates for out-of-plane measurements. The out-of-plane instrument signature that results from Rayleigh scatter in air is calculated and compared with measurement. Finally, the results of some out-of-plane Mueller matrix BRDF measurements of the backside of a silicon wafer are presented.

Automated three-axis gonioreflectometer for computer graphics applications

“…5,6 But none of these instruments combines these capabilities. For example, Germer et al 4 have built an instrument (GOSI) that achieves excellent angular coverage, but limited spectral coverage (3 wavelengths) and long measurement time (weeks for a full angular coverage).…”

“…[3][4][5][6][7][8][9][10][11][12] A goniometer is often used to hold and rotate the sample so that the angular configuration can be changed repeatedly to cover the incident and reflection hemispheres. Such instruments can achieve broad angular coverage 3,4 and broadband spectral coverage. 5,6 But none of these instruments combines these capabilities.…”

A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared

“…For the limitation of structure of the system, in the retro-direction there is about ±1°occultation. The character of the previous NIST design is that the receiving part fixed on the moving stage and the emitting part is fixed [8]. In our configuration, we exchange the position of the emitting part and the receiving part, the receiving part is mounted on an optical platform (is not move in the measurement), which is different with NIST design (for details of the placement see Fig.…”

“…The polarized BRDF contains more information than the unpolarized BRDF and can be used for target surveillance and recognition system [6,7]. NIST [8][9][10] and US Naval Research Lab [11] build measurement system respectively to get the polarized properties of the surfaces. It is common to measure the scattering properties within the plane of incidence (simplified as in-plane in the following), for it requires the least optical hardware and it is easy to build the system.…”

A validation of a ray-tracing tool used to generate bi-directional scattering distribution functions for complex fenestration systems

“…Measurements of the physical system can be made with a device such as a scanning goniophotometer (in general (Stover, 1992), example instruments (Klems and Warner, 1995;Germer and Asmail, 1997;Apian-Bennewitz and von der Hardt, 1998) or imaging systems (Ward, 1992;Andersen et al, 2001)). Measurement of the actual physical sample is ideal but time-consuming and therefore expensive to conduct, considering the wide variety of products offered in a multitude of colors, weaves, and finishes.…”