A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared

Feng, Wei; Wei, Qinhua

doi:10.1016/j.infrared.2008.08.001

Cited by 13 publications

(5 citation statements)

References 12 publications

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“…In our previous work, a PBRDF model based on microfacet theory [7,8] was employed in the application [9,10,11] .The polarized model is determined by the roughness parameters, optical constant parameters, the incident and viewing angles(including the zenith and azimuth angles) together. For there is a complex non-linear relationship between the model parameters and target output, it is hard for the traditional linear fitting method to obtain the parameters.…”

Section: Introductionmentioning

confidence: 99%

Notice of Retraction: A hybrid genetic algorithm in PBRDF modeling

Feng

Wei

et al. 2010

2010 Sixth International Conference on Natural Computation

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The polarized light scattered by the surface of a material contains information that can be used to describe the properties of the surface. Polarized Bidirectional Reflectance Distribution Function (PBRDF) is one of the most important factors used to represent the property of the surface. Because there is complex nonlinear relationship between the experimental results and model parameters, genetic algorithm is used to retrieve the model parameters. One drawback of the traditional genetic algorithm is that the convergence speed is slow and easy to fall into the local minimization. On the base of the traditional genetic algorithm to retrieve the parameters, simulated annealing (SA) algorithm is used to optimize the modeling of the PBRDF. The model for PBRDF and the designation of the hybrid algorithm is given in detail. For one typical painted surface, both the experiment results and the model calculation results are given. The calculation results of the model are demonstrated consistent well with the experimental results. The error convergence curve shows that, the hybrid genetic algorithm can avoid falling into the local minimization, and shorten the running time for the target function. Therefore, it is applicable used as a reference for target feature extraction and recognition in the future.

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Section: Introductionmentioning

confidence: 99%

Notice of Retraction: A hybrid genetic algorithm in PBRDF modeling

Feng

Wei

et al. 2010

2010 Sixth International Conference on Natural Computation

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“…The advantage of a Mm scatterometer is that it can be used to calculate how the polarization state of light reflected or transmitted in the specular region may differ from that in the off-specular or diffusely scattered regions. By measuring the polarimetric properties of the scattered light, conclusions can be drawn about the scattering mechanisms [4][5][6][7][8][9][10], for instance, a rough-surface scatterer versus a multibounce or volumetric scatterer. However, the measured signal in the off-specular region can be quite low and approach the noise floor of the measurement system.…”

Section: Introductionmentioning

confidence: 99%

Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function system

Nauyoks

Marciniak

2015

Appl. Opt.

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Since a measurement of the bidirectional scatter distribution function (BSDF) of a material is proportional to the intensity of the scattered light, a BSDF measurement system with the addition of a dual rotating retarder polarimeter can be used to calculate the Mueller matrix of a scatterer. One advantage of a BSDF system using a laser source is its large dynamic range, which allows the measurement of scattered light both near to and away from the specular region. As BSDF measurements move away from the specular region and into a more diffuse-scatter region, the measured signal decreases and may approach the system's measurement floor. Therefore, BSDF and Mueller-matrix measurements are dependent not only on the scatter from the sample but also on the noise floor of the system. By analyzing numerically created bidirectional reflectance distribution function data, we show that since the noise floor of a system is typically constant, the Mueller-matrix measurement at the noise floor appears to be that of a perfect depolarizer. Therefore, as the BSDF measurement space moves away from the high-signal region and the noise floor is approached, the Mueller matrix assigned to the sample artificially approaches that of a perfect depolarizer. The rate and location in scatter-angle space of this shift is dependent on the BSDF of the material and on the signal-to-noise ratio in the system. Therefore, caution must be taken when drawing conclusions about measured Mueller matrices for scattered light, particularly in measurement regions where the measured signal approaches the system floor.

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“…Mueller-matrix (Mm) scatterometers are of increasing interest for their ability to fully characterize the polarimetric behavior of samples [1][2][3][4][5][6][7]. The polarimetric engine of these instruments is often a dual rotating retarder (DRR).…”

Section: Introductionmentioning

confidence: 99%

Optimization of a dual-rotating-retarder polarimeter as applied to a tunable infrared Mueller-matrix scatterometer

Vap

Nauyoks

Marciniak

2013

Meas. Sci. Technol.

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The value of Mueller-matrix (Mm) scatterometers lies in their ability to simultaneously characterize the polarimetric and directional scatter properties of a sample. To extend their utility to characterizing modern optical materials in the infrared (IR), which often have very narrow resonances yet interesting polarization and directional properties, the addition of tunable IR lasers and an achromatic dual-rotating-retarder (DRR) polarimeter is necessary. An optimization method has been developed for use with the tunable IR Mm scatterometer. This method is rooted in the application of random error analysis to three different DRR retardances, λ/5, λ/4 and λ/3, for three different analyzer (A)-to-generator (G) retarder rotation ratios, θA:θG = 34:26, 25:5 and 37.5:7.5, and a variable number of intensity measurements. The product of the error analysis is in terms of the level of error that could be expected from a free-space Mm extraction for the various retardances, retarder rotation ratios and number of intensity measurements of the DRR. The optimal DRR specifications identified are a λ/3 retardance and a Fourier rotation ratio, with the number of required collected measurements dependent on the level of error acceptable to the user. Experimental results corroborate this error analysis using an achromatic 110-degree retardance-configured DRR polarimeter at 5 µm wavelength, which resulted in consistent 1% error in its free-space Mm extractions.

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A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared

Cited by 13 publications

References 12 publications

Notice of Retraction: A hybrid genetic algorithm in PBRDF modeling

Notice of Retraction: A hybrid genetic algorithm in PBRDF modeling

Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function system

Optimization of a dual-rotating-retarder polarimeter as applied to a tunable infrared Mueller-matrix scatterometer

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