<title>Combined x-ray absorption spectroscopy and x-ray powder diffraction</title>

Abstract

The complementary nature of x-ray absorption fine structure (XAFS) spectroscopy and x-ray diffraction (XRD) is described. In particular XAFS records the local structure whilst XRD detects the long range crystallinity enabling the heterogeneity of materials like single phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x-ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed oxide catalysts. SPIE Vol. 1550 X Rays in Materials Analysis Il: NovelApplications and Recent Developments(1991) / 97 Downloaded From: http://proceedings.spiedigitallibrary.org/ on 05/15/2015 Terms of Use: http://spiedl.org/terms