2011 IEEE 17th International Symposium on High Performance Computer Architecture 2011
DOI: 10.1109/hpca.2011.5749715
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Low-voltage on-chip cache architecture using heterogeneous cell sizes for high-performance processors

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Cited by 20 publications
(30 citation statements)
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“…Architectures designed specifically to take advantage of low voltage properties such as fast caches relative to logic have been proposed by Zhai et al [39] and Dreslinski et al [9]. Other work has focused on improving the reliability of large caches in low voltage processors [11,29]. While significant progress has been made in bringing this technology to market, including a prototype processor from Intel [38], many challenges remain, including reliability and high variation.…”
Section: Low Voltage Designsmentioning
confidence: 99%
“…Architectures designed specifically to take advantage of low voltage properties such as fast caches relative to logic have been proposed by Zhai et al [39] and Dreslinski et al [9]. Other work has focused on improving the reliability of large caches in low voltage processors [11,29]. While significant progress has been made in bringing this technology to market, including a prototype processor from Intel [38], many challenges remain, including reliability and high variation.…”
Section: Low Voltage Designsmentioning
confidence: 99%
“…Ghasemi et al propose the use of heterogeneous cell sizes, in order that when operating at low voltages, ways or sets of small SRAM cells are deactivated if they start to fail [17]. Khan et al propose a mixed-cell memory design, where some of the cells are more robust and failure-resistant and, therefore, more reliable candidates to store dirty cache blocks, while the rest are designed using traditional cells [21].…”
Section: Related Workmentioning
confidence: 99%
“…An effective way to reduce power consumption is voltage scaling. Unfortunately, as supply voltage decreases into the ultra-low voltage regime, the failure rate of circuits increases dramatically [1]. This failure rate worsens as technology scales, due primarily to the everincreasing process variation [2].…”
mentioning
confidence: 99%