2019
DOI: 10.1021/acsami.9b13871
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Low-Voltage, High-Performance Flexible Organic Field-Effect Transistors Based on Ultrathin Single-Crystal Microribbons

Abstract: Organic field-effect transistors (OFETs) have acquired increasing attention because of their wide range of potential applications in electronics; nevertheless, high operating voltage and low carrier mobility are considered as major bottlenecks in their commercialization. In this work, we demonstrate low-voltage, flexible OFETs based on ultrathin single-crystal microribbons. Flexible OFETs fabricated with 2,7-dioctylbenzothieno­[3,2-b]­benzothiophene (C8-BTBT) based solution-processed ultrathin single-crystal m… Show more

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Cited by 20 publications
(20 citation statements)
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References 49 publications
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“…The higher saturated carrier mobility based on C‐PVA dielectric layer at first sweep was mainly caused by a better crystallization characteristic and a larger grain size in C8‐BTBT thin films, which indicates better intrinsic carrier transport in C8‐BTBT based on C‐PVA dielectric layer (Figure S5, Supporting Information). However, the device based on CYTOP/C‐PVA layer shows a lower threshold voltage, which results in a higher reliable factor r value (Table S2, Supporting Information) . Therefore, it shows that device D has a similar effective mobility ( µ eff ) of about 6 cm 2 V −1 s −1 to the first sweep of device C, detailed comparison can be seen in Table S2 (Supporting Information).…”
Section: Resultsmentioning
confidence: 98%
“…The higher saturated carrier mobility based on C‐PVA dielectric layer at first sweep was mainly caused by a better crystallization characteristic and a larger grain size in C8‐BTBT thin films, which indicates better intrinsic carrier transport in C8‐BTBT based on C‐PVA dielectric layer (Figure S5, Supporting Information). However, the device based on CYTOP/C‐PVA layer shows a lower threshold voltage, which results in a higher reliable factor r value (Table S2, Supporting Information) . Therefore, it shows that device D has a similar effective mobility ( µ eff ) of about 6 cm 2 V −1 s −1 to the first sweep of device C, detailed comparison can be seen in Table S2 (Supporting Information).…”
Section: Resultsmentioning
confidence: 98%
“…Notably, the SS and I on / I off numbers were even better than those on Si substrates, which is perhaps because the oxygen-rich ITO could also partially oxidize the hydroxyls and therefore reduced the charge trap density and suppressed the leakage pathway [ 48 ]. As a result, a very high saturation regime mobility ( μ sat ) of 30.2 ± 4.6 cm 2 V −1 s −1 and a high effective mobility ( μ eff ) of 13.8 ± 2.1 cm 2 V −1 s −1 were obtained, and these numbers considerably outperformed all previously reported flexible OFET devices, except for a recent work [ 49 ] which used single-crystal C8-BTBT as the organic semiconductor and reported a comparable carrier mobility (33.4 and 13.3 cm 2 V −1 s −1 for μ sat and μ eff , respectively) (Table S4 ). Given that the single crystal is considered to be the intrinsic limit for enhancing the mobility, our outcome relying on the improvement of the dielectric layer is quite remarkable in approaching to this limit.…”
Section: Resultsmentioning
confidence: 70%
“…[ 57 ] The carrier mobility quantifies how efficiently the charge carries move in the semiconductor and it is calculated, in the saturation region (| V ds | > | V gs ‐ V th | > 0), from Equation (), [ 58 ] where I ds , w , and l are drain‐source current, channel width, and channel length, respectively: Ids=μwCnormali(VgsVth)22l C i is the capacitance per unit area of the gate dielectric and determines the driving voltage of the transistor, which directly affects the LET power consumption. C i depends on the dielectric constant ( k ) and the dielectric thickness ( d ) as in Equation (): [ 59 ] Cnormali=kε0d …”
Section: Basics Of Multi‐layer Letsmentioning
confidence: 99%