2001
DOI: 10.1088/0953-8984/13/50/320
|View full text |Cite
|
Sign up to set email alerts
|

Low-temperature transport properties of non-stoichiometric La0.95-xSrxMnO3manganites

Abstract: The low-temperature specific heat and electrical resistivity of the polycrystalline non-stoichiometric manganites La 0.95−x Sr x MnO 3 have been investigated in the doping region x = 0.00-0.30. The specific heat has terms proportional to T and T 3 . The resistivity of the samples decreases as T 1/2 with increasing temperature, goes through a minimum and then increases proportionally to T 3 . The temperature T min , corresponding to the minimum of the resistivity, shifts with Sr content as T min ∼ x −2/5 .

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

5
31
0

Year Published

2002
2002
2011
2011

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 16 publications
(36 citation statements)
references
References 22 publications
5
31
0
Order By: Relevance
“…At the same time, analysis of specific heat data (typical bulk property) presented in [1] seems enough plausible.…”
mentioning
confidence: 93%
See 3 more Smart Citations
“…At the same time, analysis of specific heat data (typical bulk property) presented in [1] seems enough plausible.…”
mentioning
confidence: 93%
“…Michalopoulou et al in [1] based on fitting of low temperature resistivity versus temperature dependencies measured only at zero magnetic field is absolutely insufficient for verification of applicability of QCC model (as well as in previous analogous attempts [3][4][5]). At the same time, analysis of specific heat data (typical bulk property) presented in [1] seems enough plausible.…”
mentioning
confidence: 99%
See 2 more Smart Citations
“…However, the phase coherence of electron waves has already been destroyed by the strong spontaneous ferromagnetic field in these compounds. 22,23 Second, Maritato et al 13 observed that the weak localization effect plays an increasingly important role in influencing the low-temperature resistivity upturn only for very thin films ͑t Ͻ 20 nm͒. For our sample, the film thickness is about 100 nm, which is relatively thick.…”
Section: Resultsmentioning
confidence: 66%