2017
DOI: 10.1016/j.apsusc.2017.01.147
|View full text |Cite
|
Sign up to set email alerts
|

Low temperature pulsed direct current magnetron sputtering technique for single phase β-In2S3 buffer layers for solar cell applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

3
11
0

Year Published

2019
2019
2022
2022

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 17 publications
(14 citation statements)
references
References 50 publications
3
11
0
Order By: Relevance
“…We indicated the tetragonal β-phase for In 2 S 3 . This result is in accordance with structural investigations on rf-sputtered In x S y layers reported by other groups [14,15,23], but also for structural investigations on evaporated In x S y layers [20,24]. In contrast, high-resolution transmission electron microscopy analyses revealed nanocrystalline structures for our oxygen-containing CBD-In x (O,S) y [25] and sputtered In x (O,S) y buffer layers deposited from an In 2 (O 0.25 S 0.75 ) 3 target [26] at the CIGS/buffer interface in the complete device.…”
Section: Discussionsupporting
confidence: 93%
See 1 more Smart Citation
“…We indicated the tetragonal β-phase for In 2 S 3 . This result is in accordance with structural investigations on rf-sputtered In x S y layers reported by other groups [14,15,23], but also for structural investigations on evaporated In x S y layers [20,24]. In contrast, high-resolution transmission electron microscopy analyses revealed nanocrystalline structures for our oxygen-containing CBD-In x (O,S) y [25] and sputtered In x (O,S) y buffer layers deposited from an In 2 (O 0.25 S 0.75 ) 3 target [26] at the CIGS/buffer interface in the complete device.…”
Section: Discussionsupporting
confidence: 93%
“…This trend with increasing temperature was also observed by other groups for sputtered In x S y layers [17,18,28]. In contrast, Karthikeyan et al reported an opposite trend as found for their In x S y deposited by pulsed direct magnetron sputtering [23]. From theoretical density calculations there is only a very small difference between direct and indirect transitions in β-In 2 S 3 [29,30].…”
Section: Discussionsupporting
confidence: 73%
“…1g and the calculated particle size using the Sheer formula is in good agreement with the measured size from the 400 plane of HRTEM image. Figure 1h shows Raman spectrum of the In 2 S 3 QDs with typical peaks at 304 cm −1 and 930 cm −1 [19]. Atomic force microscopy (AFM) was performed on four randomly selected In 2 S 3 QDs, marked as A, B, C, and D as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…For the In 2 S 3 -HT (25 nm) sample a much lower V OC and short circuit current (J SC ) value was recorded with a small difference in FF as compared to the 85 nm In 2 S 3 device. The diode ideality factor calculated from the ln(J) -V curve was found to be as high as 6.62, which was probably due to the low shunting resistance of 71.02 Ω.cm 2 recorded for the best performing cell with efficiency 13.6%. A similar annealing treatment is also required for CBD and thermally evaporated buffer layers to suppress the interfacial recombination due to presence of defect states formed at the heterointerface.…”
Section: Device Characterizationsmentioning
confidence: 93%
“…It has been observed that the bandgap of In 2 S 3 varies with the employed deposition technique and the S/In stoichiometric ratio. A detailed study on the nature of bandto-band transition in In 2 S 3 has been performed by Sterner et al 5 In a recent study by Karthikeyan et al, 6 a direct bandgap of 2.77 eV has been obtained for sputtered In 2 S 3 which is higher than that of CdS (2.4 eV). 7 Higher direct band gap | 479 SONI et al…”
Section: Introductionmentioning
confidence: 99%