2014
DOI: 10.1063/1.4892095
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Low-temperature plasma-deposited silicon epitaxial films: Growth and properties

Abstract: Low-temperature (≤200 °C) epitaxial growth yields precise thickness, doping, and thermal-budget control, which enables advanced-design semiconductor devices. In this paper, we use plasma-enhanced chemical vapor deposition to grow homo-epitaxial layers and study the different growth modes on crystalline silicon substrates. In particular, we determine the conditions leading to epitaxial growth in light of a model that depends only on the silane concentration in the plasma and the mean free path length of surface… Show more

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Cited by 21 publications
(25 citation statements)
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“…All the findings presented so far are in line with previous reports [16], [18], [61], [62]. According to these results and our best knowledge, we tested the most promising and simple approaches in devices which will be presented and discussed in the following.…”
Section: E Summary Of Strategies For Nanocrystalline Layerssupporting
confidence: 87%
See 1 more Smart Citation
“…All the findings presented so far are in line with previous reports [16], [18], [61], [62]. According to these results and our best knowledge, we tested the most promising and simple approaches in devices which will be presented and discussed in the following.…”
Section: E Summary Of Strategies For Nanocrystalline Layerssupporting
confidence: 87%
“…Gas Variation 1) Replacing Silane by Disilane: According to literature, the silane depletion fraction is one of the fundamental factors determining the growth mode of silicon layers, i.e., either μc-Si:H or a-Si:H [18], [61]. Similar conclusions were drawn for the growth of homoepitaxial silicon layers [62]. Therefore, a simple approach to facilitate the nucleation of μc-Si:H layers is the use of Si-precursor gases that are easier to dissociate compared with SiH 4 and, therefore, enable to reach high depletion regimes more easily.…”
Section: Resultsmentioning
confidence: 60%
“…The collimated infrared beam of the QCL was first modulated with a mechanical chopper at a frequency of 1 kHz, then was split into two beamlets. Similarily, it was found in a separate study that thin films deposited on c-Si substrate yield an epitaxy to a-Si:H transition region situated between 3% and 9% [26]. With this approach, the difference between the SiH 4 consumption efficiency, measured in the pumping line, and the SiH 4 depletion fraction, measured in the reactor volume, could be confirmed experimentally and theoretically.…”
Section: Monitoring Of Pecvd Processes Containing Silanesupporting
confidence: 84%
“…For this, we explored deposition conditions similar to those fostering nanocrystalline silicon thin-film growth [53][54][55] and silicon epitaxy 56 , hence characterized by a considerably lower silane concentration in the deposition plasma than conventional doped a-Si:H layers. Recall that nanocrystalline Si:H thin films typically present a nucleation region where the material is still amorphous, the so-called protocrystalline growth regime 57 , which has a thickness that may vary up to several tens of nanometres, depending on the deposition parameters 58 .…”
Section: Requirements For E Cient Tunnel-ibc Solar Cellsmentioning
confidence: 99%