2005
DOI: 10.1143/jjap.44.2405
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Low-Temperature Formation of Poly-Si1-xGex (x: 0–1) on SiO2 by Au-Mediated Lateral Crystallization

Abstract: The Au-mediated low-temperature (400 C) crystallization of amorphous-Si 1Àx Ge x (x: 0-1) on SiO 2 has been investigated. A growth velocity exceeding 20 mm/h was obtained for samples in the entire range of Ge fractions (x: 0-1), although it decreased with increasing Ge fraction. These values are much higher than those obtained by conventional Ni-mediated crystallization. As a result, strain-free poly-Si 1Àx Ge x (x: 0-1) with large areas (>20 mm) were obtained at a low temperature (400 C). This newly developed… Show more

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Cited by 10 publications
(12 citation statements)
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“…In our case, diffusion mediated by Ni/Au in the Si 70 Ge 30 alloy nanowire occurred at ∼27 nm s −1 , and that mediated by Ni occurred at ∼16 nm s −1 . These values are slightly higher than those in bulk films, but the diffusion depth of metal decreases with increasing Ge concentration [22], and we might expect axial diffusion only, in the case of one-dimensional nanostructures. We also expect lower electrical conductance from Ni-contacted alloy nanowire devices because the conductance is inversely proportional to the channel lengths in diffusive systems.…”
Section: Resultsmentioning
confidence: 60%
“…In our case, diffusion mediated by Ni/Au in the Si 70 Ge 30 alloy nanowire occurred at ∼27 nm s −1 , and that mediated by Ni occurred at ∼16 nm s −1 . These values are slightly higher than those in bulk films, but the diffusion depth of metal decreases with increasing Ge concentration [22], and we might expect axial diffusion only, in the case of one-dimensional nanostructures. We also expect lower electrical conductance from Ni-contacted alloy nanowire devices because the conductance is inversely proportional to the channel lengths in diffusive systems.…”
Section: Resultsmentioning
confidence: 60%
“…In line with this, we have been investigating laser annealing (10), solid-phase crystallization (11)(12)(13)(14)(15) and metal-induced lateral crystallization (MILC) (16)(17)(18)(19) of a-SiGe on insulating films. These approaches are schematically summarized in Fig.2.…”
Section: Low Temperature Sige Growth On Insulating Filmmentioning
confidence: 96%
“…In line with this, we have been investigating laser annealing (10), solid-phase crystallization (SPC) (11)(12)(13)(14)(15) and metal-induced lateral crystallization (MILC) (16)(17)(18)(19) of a-SiGe on insulating films. These approaches are schematically summarized in Fig.2.…”
Section: Introductionmentioning
confidence: 98%