2006
DOI: 10.1080/10584580600663326
|View full text |Cite
|
Sign up to set email alerts
|

LOW TEMPERATURE DEPOSITION OF Pb(Zr,Ti)O3 THIN FILMS BY LIQUID DELIVERY MOCVD USING A COCKTAIL SOURCE WITH Pb(DMAMP)2, Zr(MMP)4 AND Ti(MMP)4

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
5
0

Year Published

2007
2007
2020
2020

Publication Types

Select...
4
1

Relationship

3
2

Authors

Journals

citations
Cited by 5 publications
(5 citation statements)
references
References 12 publications
0
5
0
Order By: Relevance
“…In this study, we provide a suite of new Pb‐perovskite processes used to grow PZT, PHT, and PHO using alkyl‐amide ALD precursors for the 4+ cations (tetrakis dimethylamino titanium [TDMAT], zirconium [TDMAZ] and hafnium [TDMAH], respectively), and Pb(DMAMP) 2 for the lead cation. We implemented Pb(DMAMP) 2 as the lead precursor due to its suitably high vapor pressure, high thermal stability, and quality of ferroelectric and dielectric properties previously reported when Pb(DMAMP) 2 was used to grow PTO in conjunction with various Ti precursors including TDMAT 26–28 . TDMAZ and TDMAH were chosen as the Zr and Hf precursors, respectively, because their binary oxide ALD windows partially overlapped the same for both TDMAT and Pb(DMAMP) 2 29,30 …”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…In this study, we provide a suite of new Pb‐perovskite processes used to grow PZT, PHT, and PHO using alkyl‐amide ALD precursors for the 4+ cations (tetrakis dimethylamino titanium [TDMAT], zirconium [TDMAZ] and hafnium [TDMAH], respectively), and Pb(DMAMP) 2 for the lead cation. We implemented Pb(DMAMP) 2 as the lead precursor due to its suitably high vapor pressure, high thermal stability, and quality of ferroelectric and dielectric properties previously reported when Pb(DMAMP) 2 was used to grow PTO in conjunction with various Ti precursors including TDMAT 26–28 . TDMAZ and TDMAH were chosen as the Zr and Hf precursors, respectively, because their binary oxide ALD windows partially overlapped the same for both TDMAT and Pb(DMAMP) 2 29,30 …”
Section: Introductionmentioning
confidence: 99%
“…We implemented Pb(DMAMP) 2 as the lead precursor due to its suitably high vapor pressure, high thermal stability, and quality of ferroelectric and dielectric properties previously reported when Pb(DMAMP) 2 was used to grow PTO in conjunction with various Ti precursors including TDMAT. [26][27][28] TDMAZ and TDMAH were chosen as the Zr and Hf precursors, respectively, because their binary oxide ALD windows partially overlapped the same for both TDMAT and Pb(DMAMP) 2 . 29,30 Both PZT and PHT displayed phase purity and ferroelectric switching behavior with low leakage current density.…”
mentioning
confidence: 99%
“…Thus, only deposition of thick films with a thickness larger than several mm (or more) has been reported on porous substances. [7][8][9][10] In recent years, we have developed high-quality oxide thin films, namely, SrBi 2 TaO 9 (SBT) 11,12) and Pb(Zr,Ti)O 3 (PZT), 13) using liquid-delivery metal-organic chemical vapor deposition (LD-MOCVD); we considered that LD-MOCVD would enable resolution of the above difficulty because it involves layer-by-layer deposition. Additionally, LD-MOCVD is commonly used in semiconductor fabrication and is considered to be one of the most suitable methods for the mass-production of oxide thin films.…”
mentioning
confidence: 99%
“…The LD-MOCVD apparatus is described in detail elsewhere. 13) The crystallinity of the deposited films was evaluated by the -2 method using X-ray diffraction (XRD). In general, the intensity of the diffraction of films with the same crystal structure and thickness reflects their crystallinity.…”
mentioning
confidence: 99%
“…Liquid delivery metalorganic chemical vapor deposition (LD-MOCVD) has been researched and developed as a fabrication technique for ferroelectric thin films. [1][2][3][4][5][6][7][8][9][10][11] However, notwithstanding its capacity for high-quality thin film formation, the LD-MOCVD system is highly complex and requires continuous maintenance for stable operation. The most important subjects to be developed related to LD-MOCVD techniques are the vaporization system of liquid sources and the transport of vaporized source gases.…”
mentioning
confidence: 99%