2012
DOI: 10.1002/cvde.201206980
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Low Temperature CVD of Thin, Amorphous Boron‐Carbon Films for Neutron Detectors

Abstract: Abstract:Thin, amorphous boron-carbon films were deposited at low temperature (400-600 °C) by thermally activated CVD using the organoborane triethylboron (TEB) as a single precursor. Two different carrier gases were tested. At 600 °C using argon as carrier gas the deposition rate was close to 1 µm/h. The film had a density of 2.14 g/cm 3 with a B/C-ratio of 3.7. When hydrogen was used as carrier gas the film density was 2.42 g/cm 3 , the B/C ratio 4.6 and the deposition rate 0.35 µm/h. The hydrogen content in… Show more

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Cited by 28 publications
(37 citation statements)
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“…39,40 Fabrication of boron carbide coatings by evaporation methods was demonstrated and film thicknesses up to 20 lm were reported, but the deposited areas were of comparatively small size (several cm 2 ). [41][42][43][44] The present report describes the preparation of B 4 C coatings by DC magnetron sputtering on Si and Al substrates. Further, it discusses the results of thorough structural characterization (by spectral reflectance and profilometry, XRD, Scanning Electron Microscopy (SEM), and X-Ray Reflectometry (XRR)) as well as chemical and isotopic analysis (by X-ray-Photoelectron Spectroscopy (XPS), Secondary-Ion-Mass-Spectrometry (SIMS), and nuclear reaction analysis (NRA)).…”
mentioning
confidence: 99%
“…39,40 Fabrication of boron carbide coatings by evaporation methods was demonstrated and film thicknesses up to 20 lm were reported, but the deposited areas were of comparatively small size (several cm 2 ). [41][42][43][44] The present report describes the preparation of B 4 C coatings by DC magnetron sputtering on Si and Al substrates. Further, it discusses the results of thorough structural characterization (by spectral reflectance and profilometry, XRD, Scanning Electron Microscopy (SEM), and X-Ray Reflectometry (XRR)) as well as chemical and isotopic analysis (by X-ray-Photoelectron Spectroscopy (XPS), Secondary-Ion-Mass-Spectrometry (SIMS), and nuclear reaction analysis (NRA)).…”
mentioning
confidence: 99%
“…Films deposited on (100)-oriented Si substrates in H2 and Ar atmospheres respectively, within 700 -1200 °C were characterized and discussed together with the previously published results for TEB (400 -600 °C) [33].…”
Section: Teb and Tmb In Thermal Cvdmentioning
confidence: 91%
“…This type of reaction was reported to occur at 300 °C [35], and at higher temperatures the other ethyl groups could further be eliminated to form BH3 [33]. elimination from C2H4 [61].…”
Section: Gas Phase Cvd Chemistry and Quantum Chemical Calculationsmentioning
confidence: 94%
“…[16][17][18] The PVD method is a line-of-sight deposition technique and while CVD is not to the same extent. CVD has been demonstrated to deposit well-defined, high quality singlephase boron carbide films [14].…”
Section: Boron Carbidesmentioning
confidence: 99%
“…We used a combined experimental and theoretical approach with both film deposition and quantum chemical calculations. We deposited films in two different atmospheres; H 2 and Ar within 700 -1200 °C and used also previously published results (400-600 °C) [17] to get a more complete picture.…”
Section: Paper I Gas Phase Chemical Vapor Deposition Chemistry Of Trimentioning
confidence: 99%