2019
DOI: 10.1109/tcsi.2018.2876785
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Low-Power Near-Threshold 10T SRAM Bit Cells With Enhanced Data-Independent Read Port Leakage for Array Augmentation in 32-nm CMOS

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Cited by 64 publications
(44 citation statements)
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“…On the other hand, the WWL12T/D12T cell consumes higher area 1.06 × /1.04 × when compared to WALP11T due to the presence of an additional NMOS transistor. Table 1 reports the comparison of the proposed WALP11T cell, in terms of major design metrics, with the previously proposed FD8T [11], BI11T [12], SEDF9T [15], WWL12T [23] and D12T [24] cells as well as additional state-of-the-art SRAM cells such as transmission-gate based 9T (TG9T) [32], power-gated 9T (PG9T) [33], differential writing 10T (10T-P1) [34] and feedback-cutting 11T (FC11T) [35] at V DD = 0.3 V. As is evident, the WALP11T cell shows shorter T RA than most other cells used in this work. However, the FD8T shows shorter T RA than the proposed cell due to its higher β-ratio and its structural similarity to the conventional 6T cell.…”
Section: Layout Areamentioning
confidence: 99%
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“…On the other hand, the WWL12T/D12T cell consumes higher area 1.06 × /1.04 × when compared to WALP11T due to the presence of an additional NMOS transistor. Table 1 reports the comparison of the proposed WALP11T cell, in terms of major design metrics, with the previously proposed FD8T [11], BI11T [12], SEDF9T [15], WWL12T [23] and D12T [24] cells as well as additional state-of-the-art SRAM cells such as transmission-gate based 9T (TG9T) [32], power-gated 9T (PG9T) [33], differential writing 10T (10T-P1) [34] and feedback-cutting 11T (FC11T) [35] at V DD = 0.3 V. As is evident, the WALP11T cell shows shorter T RA than most other cells used in this work. However, the FD8T shows shorter T RA than the proposed cell due to its higher β-ratio and its structural similarity to the conventional 6T cell.…”
Section: Layout Areamentioning
confidence: 99%
“…Table 1 reports the comparison of the proposed WALP11T cell, in terms of major design metrics, with the previously proposed FD8T [11], BI11T [12], SEDF9T [15], WWL12T [23] and D12T [24] cells as well as additional state‐of‐the‐art SRAM cells such as transmission‐gate based 9T (TG9T) [32], power‐gated 9T (PG9T) [33], differential writing 10T (10T‐P1) [34] and feedback‐cutting 11T (FC11T) [35] at VDD=0.3thinmathspacenormalV. As is evident, the WALP11T cell shows shorter TRA than most other cells used in this work.…”
Section: Comparison Summarymentioning
confidence: 99%
“…Many leakage reduction techniques such as super cut‐off CMOS scheme (SSCMOS), dynamic control of power rails in virtually powered read ports, half‐V DD bitline pre‐charge technique, or read‐assist circuits are suggested to address the degraded read performance 2,6,7 . However, their use incurs large area overhead, extra routing efforts, high power consumption, or inefficacy at lower technology nodes 8 . Several SRAM cells with read ports having two to four transistors (2T–4T) are presented in previous studies 8–14 .…”
Section: Introductionmentioning
confidence: 99%
“…In 6T SRAM cell, differential bit-line structure increases read and write power dissipation as of single-ended 6T SRAM cell [1]. Single ended SRAM topologies [1,16,[22][23][24] are reported to reduce the power dissipation during read/write operation. P.Singh et al [18] proposed a positive feedback-controlled (PCF10T) SRAM cell with a single ended read operation.…”
Section: Introductionmentioning
confidence: 99%