2018
DOI: 10.1364/prj.6.001062
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Low-noise 13  μm InAs/GaAs quantum dot laser monolithically grown on silicon

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Cited by 43 publications
(17 citation statements)
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“…In addition, an ultra-low relative intensity noise (RIN) (< -150 dB/Hz) was measured in the range of 4 -16 GHz. Based on these excellent noise characteristics, 25.6 Gb/s data transmission over 13.5 km SMF-28 has been demonstrated [49]. This low-noise QD laser shows promise for future inter/hyper data-centre interconnection.…”
Section: Fp Lasers On Offcut Si Substratementioning
confidence: 95%
“…In addition, an ultra-low relative intensity noise (RIN) (< -150 dB/Hz) was measured in the range of 4 -16 GHz. Based on these excellent noise characteristics, 25.6 Gb/s data transmission over 13.5 km SMF-28 has been demonstrated [49]. This low-noise QD laser shows promise for future inter/hyper data-centre interconnection.…”
Section: Fp Lasers On Offcut Si Substratementioning
confidence: 95%
“…The InAs QDs are embedded in 8 nm In0.15Ga0.85As quantum wells (QWs) and show a dot density of 3 × 10 10 cm -2 . More information on the growth can be found in [3]. The finished wafers are fabricated into 2.5 mm × 2.2 m narrow ridge-waveguide lasers and the thinned laser bars are mounted on a copper heatsink.…”
Section: Epitaxial Structure and Device Layoutmentioning
confidence: 99%
“…To realize single transverse mode and low threshold current of Si-based light source, 2.2 μm width narrow ridge waveguide InAs/GaAs QD laser devices with 95% high reflection coating were fabricated [5]. Fig.2 (a) shows the LIV measurement of a 2.2 μm × 2.5 mm Si-based narrow-ridge-waveguide laser device.…”
Section: Low Noise 1300 Nm Inas/gaas Qd Laser Grown On Silicon With Nmentioning
confidence: 99%