“…PC imaging of electric fields at atomic resolution is fairly straightforward with at hin sample.T he technique is also capable of measuring long-range fields,however.Inthis case, sample and experimental parameters must be carefully taken into account, especially if interfaces are present, since scattering information due to crystal structure can be convolved with that originating from fields. [52,83,84] Nevertheless,m easurement of long-range electric fields has been demonstrated, [85,86] for example as shown in Figure 3. Figure 3c.Aclear feature is observed in the horizontal, but not vertical, direction at the junction, due to the built-in horizontal electric field from the difference in dopants across the interface (fainter vertical features can also be seen near the junction from variations in doping concentration).…”