2019
DOI: 10.1002/anie.201902993
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Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials

Abstract: Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State‐of‐the‐art atomic resolution or in situ scanning transmission electron microscopy and electron energy‐loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single‐atom resolution, but they are not able to measure many properties… Show more

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Cited by 20 publications
(8 citation statements)
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References 158 publications
(86 reference statements)
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“…High energy spectroscopy, 536 such as X-ray photoelectron spectroscopy (XPS), 189,232,393,537 electron energy loss This journal is © the Owner Societies 2022 spectroscopy (EELS), 286,538 energy-dispersive X-ray spectroscopy (EDS or EDX), 286 and Auger electron spectroscopy (AES), 192 are direct methods to analyze element composition of 2D materials using high energy beam radiation (e.g., photon, electron, or ion).…”
Section: High Energy Spectroscopymentioning
confidence: 99%
“…High energy spectroscopy, 536 such as X-ray photoelectron spectroscopy (XPS), 189,232,393,537 electron energy loss This journal is © the Owner Societies 2022 spectroscopy (EELS), 286,538 energy-dispersive X-ray spectroscopy (EDS or EDX), 286 and Auger electron spectroscopy (AES), 192 are direct methods to analyze element composition of 2D materials using high energy beam radiation (e.g., photon, electron, or ion).…”
Section: High Energy Spectroscopymentioning
confidence: 99%
“…offered a fundamental vision for how various classes of techniques can be successfully paired with each other and with in situ characterization to gain important insights into the static and dynamic behavior that occurred at the functional interfaces. [ 188 ] To address Li dendrite and further commercialize SSBs, the degree of coupling of the Young's modulus of lithium, SSE, and cathode particles should be considered comprehensively. Young's moduli of metallic lithium whiskers measured by Zhang et al.…”
Section: Advanced Characterization Techniquesmentioning
confidence: 99%
“…Additionally, advanced analytical microscopy techniques coupled to the microscope will shed light on optical and optoelectronic properties. 418 Advances in electron energy loss spectroscopy (EELS, used in STEM), 419 in particular, could give further insight on the connection between composition (e.g., doping levels, oxidation states) 420 and electronic structure (bandgap, plasmon frequencies, etc. [421][422][423] ), temporal transformation of chemical properties 424 and atomic-resolution of interfaces of complex nanostructures.…”
Section: Perspectivementioning
confidence: 99%