Low-frequency noise in III–V high-speed devices

Pénarier, A.; Jarrix, Sylvie; Delseny, C.; Pascal, F.; Vildeuil, J.C.; Valenza, M.; Rigaud, D.

doi:10.1049/ip-cds:20020330

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Noise Measurement and Correction Methods1

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Cited by 8 publications

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“…The two-port measurement setup was similar to the experimental setup given in [1]. It comprised of two low noise amplifiers (SR560) at each port and a two channel FFT analyzer (SR780) as shown in Fig.…”

Section: Noise Measurement and Correction Methodsmentioning

confidence: 99%

Accurately measured two-port low frequency noise and correlation of GaAs based HBTs

Sevimli

Parker

Fattorini³

2011

2011 21st International Conference on Noise and Fluctuations

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Accurately measured low frequency noise and correlation of GaAs based Heterojunction Bipolar Transistors (HBTs) have been reported between 10 Hz and 100 kHz. The system noises were removed from the data linearly, using noise correlation matrices. Noise shapes and correlation coefficients of HBTs from separate test pieces and of two emitters sizes were compared to reveal possible aging effects. Simulated 1/f noise with a simple non-linear transistor model was used to verify the accuracy of the method.

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Section: Noise Measurement and Correction Methodsmentioning

confidence: 99%