2022
DOI: 10.1016/j.physrep.2022.06.005
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Low-frequency noise in downscaled silicon transistors: Trends, theory and practice

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Cited by 8 publications
(4 citation statements)
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“… The development of simulation tools will also benefit the SPAD modeling process. Currently, TCAD is commonly used for simulating electric parameters of SPADs, including the electric field distributions, ionization coefficients, and breakdown voltage, but not their noise performance [ 121 ]. However, these parameters need to be exported to be further processed by other software, such as MATLAB.…”
Section: Research Challengesmentioning
confidence: 99%
“… The development of simulation tools will also benefit the SPAD modeling process. Currently, TCAD is commonly used for simulating electric parameters of SPADs, including the electric field distributions, ionization coefficients, and breakdown voltage, but not their noise performance [ 121 ]. However, these parameters need to be exported to be further processed by other software, such as MATLAB.…”
Section: Research Challengesmentioning
confidence: 99%
“…In particular, these transistors are present in several types of non-volatile memories, such as the organic phase-change memory transistors (OPCMTs) [9], transistor-based organic flash memories [5,10], organic resistive random-access memories (RRAMs) [11][12][13], organic ferroelectric field-effect-transistors [14][15][16][17], and magnetoresistive random-access memory (MRAM) [18]. Organic devices can also be found in optoelectronic memory applications, used in image capturing, information recording, or logic data processing, where the devices combine the functions of electrical memory with photodetection [19][20][21][22][23][24][25][26].…”
Section: Introductionmentioning
confidence: 99%
“…Many of the memory transistors are based on hysteresis effects present in their electrical characteristics, in which the charge trapping at the semiconductor-dielectric interface in both metal-oxidesemiconductor field-effect transistors (MOSFETs) or TFTs plays an important role [23,25,[27][28][29][30][31], apart from affecting its low-frequency noise and light-sensitive characteristics [19][20][21][22]. While it is considered a desirable feature in memory devices, hysteresis in the electrical characteristics of other devices can be a serious constraint, in particular in transistors in which electrical stability is a requirement for proper performance [32][33][34].…”
Section: Introductionmentioning
confidence: 99%
“…The performance of all electronic devices, including diodes [35,36], bipolar junction transistors [37,38], field effect transistors (FETs) [39][40][41], metal oxide semiconductor field effect transistors (MOSFETs) [42], even optoelectronic devices such as light emitting diodes (LEDs) [43][44][45], lasers [46][47][48], solar cells [49][50][51] and photodetectors [52][53][54] depend upon the charge transport within the device material. The charge carriers in semiconductors are electrons and holes, which are available in the conduction band and valence band respectively.…”
Section: Introductionmentioning
confidence: 99%